@inproceedings{b29f7f66a0d34541b3e326ddef765b90,
title = "Scattering loss in thin, shallow-ridge silion-on-insulator waveguides",
abstract = "Roughness induced scattering in thin, shallow-ridge silicon on insulator waveguides is analyzed by coupled mode theory and verified experimentally. Roughness in different waveguide regions causes different scattering natures of TM and TE modes.",
author = "Nguyen, {Thach G.} and Tummidi, {Ravi S.} and Robert Pafchek and Koch, {Thomas L.} and Arnan Mitchell",
year = "2012",
language = "English (US)",
isbn = "9781467318396",
series = "2012 Conference on Lasers and Electro-Optics, CLEO 2012",
booktitle = "2012 Conference on Lasers and Electro-Optics, CLEO 2012",
note = "2012 Conference on Lasers and Electro-Optics, CLEO 2012 ; Conference date: 06-05-2012 Through 11-05-2012",
}