@inproceedings{6b66ee42f1a445db9a67bb0e7938ad20,
title = "Scattering loss in thin, shallow-ridge silion-on-insulator waveguides",
abstract = "Roughness induced scattering in thin, shallow-ridge silicon on insulator waveguides is analyzed by coupled mode theory and verified experimentally. Roughness in different waveguide regions causes different scattering natures of TM and TE modes.",
author = "Nguyen, {Thach G.} and Tummidi, {Ravi S.} and Robert Pafchek and Koch, {Thomas L.} and Arnan Mitchell",
year = "2012",
doi = "10.1364/cleo_at.2012.jw4a.81",
language = "English (US)",
isbn = "9781557529435",
series = "CLEO: Applications and Technology, CLEO_AT 2012",
publisher = "Optical Society of America (OSA)",
pages = "JW4A.81",
booktitle = "CLEO",
note = "CLEO: Applications and Technology, CLEO_AT 2012 ; Conference date: 06-05-2012 Through 11-05-2012",
}