Scanning long-wave optical test system - A new ground optical surface slope test system

Tianquan Su, Won Hyun Park, Robert E. Parks, Peng Su, James H. Burge

Research output: Chapter in Book/Report/Conference proceedingConference contribution

24 Scopus citations


The scanning long-wave optical test system (SLOTS) is under development at the University of Arizona to provide rapid and accurate measurements of aspherical optical surfaces during the grinding stage. It is based on the success of the software configurable optical test system (SCOTS) which uses visible light to measure surface slopes. Working at long wave infrared (LWIR, 7-14 um), SLOTS measures ground optical surface slopes by viewing the specular reflection of a scanning hot wire. A thermal imaging camera collects data while motorized stages scan the wire through the field. Current experiments show that the system can achieve a high precision at micro-radian level with fairly low cost equipment. The measured surface map is comparable with interferometer for slow optics. This IR system could be applied early in the grinding stage of fabrication of large telescope mirrors to minimize the surface shape error imparted during processing. This advantage combined with the simplicity of the optical system (no null optics, no high power carbon dioxide laser) would improve the efficiency and shorten the processing time.

Original languageEnglish (US)
Title of host publicationOptical Manufacturing and Testing IX
StatePublished - 2011
EventOptical Manufacturing and Testing IX - San Diego, CA, United States
Duration: Aug 22 2011Aug 24 2011

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
ISSN (Print)0277-786X


OtherOptical Manufacturing and Testing IX
Country/TerritoryUnited States
CitySan Diego, CA


  • Ground surface
  • Long wave infrared
  • Optical testing
  • Reflection deflectometry
  • Slope measurement

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering


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