Scanning interferometric apertureless microscopy: Optical imaging at 10 angstrom resolution

F. Zenhausern, Y. Martin, H. K. Wickramasinghe

Research output: Contribution to journalArticlepeer-review

587 Scopus citations


Interferometric near-field optical microscopy achieving a resolution of 10 angstroms is demonstrated. The scattered electric field variation caused by a vibrating probe tip in close proximity to a sample surface is measured by encoding it as a modulation in the optical phase of one arm of an interferometer. Unlike in regular near-field optical microscopes, where the contrast results from a weak source (or aperture) dipole interacting with the polarizability of the sample, the present form of imaging relies on a fundamentally different contrast mechanism: sensing the dipole-dipole coupling of two externally driven dipoles (the tip and sample dipoles) as their spacing is modulated.

Original languageEnglish (US)
Pages (from-to)1083-1085
Number of pages3
Issue number5227
StatePublished - 1995

ASJC Scopus subject areas

  • General


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