Abstract
The four important polishing metrics: the uniformity of polishing; the rate material removal; surface microroughness; and subsurface damage; are investigated. It is found that for 25-mm-diam fused silica samples, the average peak-to-valley nonuniformity is of order of 0.1 μm/day, and the removal rate is 1.4 μm/day. The typical surface roughness is 3.5 nm after 3 days, and the subsurface damage is removed in about 3.5 days.
Original language | English (US) |
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Pages (from-to) | 2089-2092 |
Number of pages | 4 |
Journal | Optical Engineering |
Volume | 38 |
Issue number | 12 |
DOIs | |
State | Published - Dec 1999 |
ASJC Scopus subject areas
- Atomic and Molecular Physics, and Optics
- General Engineering