Rigorous modeling of lateral leakage loss in SOI thin-ridge waveguides and couplers

Thach G. Nguyen; Ravi S. Tummidi; Thomas L. Koch; Arnan Mitchell

doi:10.1109/LPT.2009.2013965

Rigorous modeling of lateral leakage loss in SOI thin-ridge waveguides and couplers

Thach G. Nguyen, Ravi S. Tummidi, Thomas L. Koch, Arnan Mitchell

Research output: Contribution to journal › Article › peer-review

68 Scopus citations

Abstract

The transverse-magnetic to transverse-electric (TM-TE) mode coupling properties and the lateral leakage loss behavior of the propagating TM-like mode in silicon-on-insulator thin-ridge waveguides and directional couplers are investigated. Accurate calculation of the lateral leakage is performed by a mode matching technique in which the calculation window is left fully open in the lateral direction.

Original language	English (US)
Pages (from-to)	486-488
Number of pages	3
Journal	IEEE Photonics Technology Letters
Volume	21
Issue number	7
DOIs	https://doi.org/10.1109/LPT.2009.2013965
State	Published - Apr 1 2009
Externally published	Yes

Keywords

Leaky waves
Optical losses
Optical waveguides
Silicon-on-insulator (SOI) technology

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Atomic and Molecular Physics, and Optics
Electrical and Electronic Engineering

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10.1109/LPT.2009.2013965

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abstract = "The transverse-magnetic to transverse-electric (TM-TE) mode coupling properties and the lateral leakage loss behavior of the propagating TM-like mode in silicon-on-insulator thin-ridge waveguides and directional couplers are investigated. Accurate calculation of the lateral leakage is performed by a mode matching technique in which the calculation window is left fully open in the lateral direction.",

keywords = "Leaky waves, Optical losses, Optical waveguides, Silicon-on-insulator (SOI) technology",

author = "Nguyen, {Thach G.} and Tummidi, {Ravi S.} and Koch, {Thomas L.} and Arnan Mitchell",

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AU - Koch, Thomas L.

AU - Mitchell, Arnan

PY - 2009/4/1

Y1 - 2009/4/1

N2 - The transverse-magnetic to transverse-electric (TM-TE) mode coupling properties and the lateral leakage loss behavior of the propagating TM-like mode in silicon-on-insulator thin-ridge waveguides and directional couplers are investigated. Accurate calculation of the lateral leakage is performed by a mode matching technique in which the calculation window is left fully open in the lateral direction.

AB - The transverse-magnetic to transverse-electric (TM-TE) mode coupling properties and the lateral leakage loss behavior of the propagating TM-like mode in silicon-on-insulator thin-ridge waveguides and directional couplers are investigated. Accurate calculation of the lateral leakage is performed by a mode matching technique in which the calculation window is left fully open in the lateral direction.

KW - Leaky waves

KW - Optical losses

KW - Optical waveguides

KW - Silicon-on-insulator (SOI) technology

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Rigorous modeling of lateral leakage loss in SOI thin-ridge waveguides and couplers

Abstract

Keywords

ASJC Scopus subject areas

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