Rigid body motion tracking in Axial Shift Mapping for measuring astronomical X-ray mirror figure

Brandon D. Chalifoux, Hayden J. Wisniewski, Mark L. Schattenburg, Ralf K. Heilmann, Ian J. Arnold, Mallory M. Whalen

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Future X-ray telescopes will require measuring thousands of grazing-incidence mirrors with nanometer accuracy and high throughput. Fizeau interferometry will require accurately separating the reference surface from the surface under test, a challenging proposition for optical surfaces that are highly off-axis conics. We present a lateral shifting interferometry approach called Axial Shift Mapping (ASM), in which we measure the surface under test at multiple positions and numerically separate the reference and test surfaces. In this paper, we estimate the measurement accuracy that would be required for an exemplary 0.5 arcsecond half-power diameter angular resolution telescope. We mathematically describe the procedure for using ASM, plus a lateral shift, to extract the most important quantities for X-ray telescope mirrors: axial profile (including the quadratic component) and cone angle variation. We also conclude that the radius and cone angle of a mirror are unknowable with ASM alone.

Original languageEnglish (US)
Title of host publicationOptics and Photonics for Advanced Dimensional Metrology III
EditorsPeter J. de Groot, Felipe Guzman, Pascal Picart
PublisherSPIE
ISBN (Electronic)9781510673120
DOIs
StatePublished - 2024
EventOptics and Photonics for Advanced Dimensional Metrology III 2024 - Strasbourg, France
Duration: Apr 9 2024Apr 11 2024

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume12997
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceOptics and Photonics for Advanced Dimensional Metrology III 2024
Country/TerritoryFrance
CityStrasbourg
Period4/9/244/11/24

Keywords

  • interferometry
  • manufacturing
  • off-axis conics
  • self-referencing metrology
  • X-ray optics

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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