Resistance Drift Convergence and Inversion in Amorphous Phase Change Materials

Julian Pries, Christian Stenz, Lisa Schäfer, Alexander Gutsche, Shuai Wei, Pierre Lucas, Matthias Wuttig

Research output: Contribution to journalArticlepeer-review

4 Scopus citations

Abstract

Phase change materials (PCMs) are key to the development of artificial intelligence technologies such as high-density memories and neuromorphic computing, thanks to their ability for multi-level data storage through stepwise resistive encoding. Individual resistance levels are realized by adjusting the crystalline and amorphous volume fraction of the memory cell. However, the amorphous phase exhibits a drift in resistance over time that has so far hindered the commercial implementation of multi-level storage schemes. In this study, the underlying physical process of resistance drift with the goal of modeling is elucidated that will help minimize and potentially overcome drift in PCM memory devices. Clear evidence is provided that the resistance drift is dominated by glass dynamics. Resistivity convergence and drift inversion for the amorphous chalcogenide Ge15Te85 and the PCM Ge3Sb6Te5 are experimentally demonstrated and these changes are successfully predicted with a glass dynamics model. This new insight into the resistance drift process provides tools for the development of advanced PCM devices.

Original languageEnglish (US)
Article number2207194
JournalAdvanced Functional Materials
Volume32
Issue number48
DOIs
StatePublished - Nov 24 2022

Keywords

  • data storages
  • glass dynamics
  • phase change materials
  • rejuvenation
  • resistance drifts
  • structural relaxations

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • General Chemistry
  • Condensed Matter Physics
  • General Materials Science
  • Electrochemistry
  • Biomaterials

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