Remote attitude measurement via Doppler interferometer

David J. Wilson; Charles E. Craven; Donald R. Snyder; Mark F. Hopkins; Russell A. Chipman; Randall R. Hodgson

doi:10.1117/12.962922

Remote attitude measurement via Doppler interferometer

David J. Wilson, Charles E. Craven, Donald R. Snyder, Mark F. Hopkins, Russell A. Chipman, Randall R. Hodgson

Research output: Contribution to journal › Conference article › peer-review

Abstract

Pitch and yaw of objects moving at high velocities can be measured with a Doppler interferometer system employing corner cube retroreflectors mounted on the moving object. Measurement of pitch or yaw alone was demonstrated in laboratory and field experiments. Using the Jones calculus, the polarization considerations for measuring both pitch and yaw simultaneously have been analyzed.

Original language	English (US)
Pages (from-to)	503-517
Number of pages	15
Journal	Proceedings of SPIE - The International Society for Optical Engineering
Volume	1166
DOIs	https://doi.org/10.1117/12.962922
State	Published - Jan 25 1990
Externally published	Yes
Event	Polarization Considerations for Optical Systems II 1989 - San Diego, United States Duration: Aug 7 1989 → Aug 11 1989

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Computer Science Applications
Applied Mathematics
Electrical and Electronic Engineering

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10.1117/12.962922

Cite this

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title = "Remote attitude measurement via Doppler interferometer",

abstract = "Pitch and yaw of objects moving at high velocities can be measured with a Doppler interferometer system employing corner cube retroreflectors mounted on the moving object. Measurement of pitch or yaw alone was demonstrated in laboratory and field experiments. Using the Jones calculus, the polarization considerations for measuring both pitch and yaw simultaneously have been analyzed.",

author = "Wilson, {David J.} and Craven, {Charles E.} and Snyder, {Donald R.} and Hopkins, {Mark F.} and Chipman, {Russell A.} and Hodgson, {Randall R.}",

year = "1990",

month = jan,

day = "25",

doi = "10.1117/12.962922",

language = "English (US)",

volume = "1166",

pages = "503--517",

journal = "Proceedings of SPIE - The International Society for Optical Engineering",

issn = "0277-786X",

publisher = "SPIE",

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TY - JOUR

T1 - Remote attitude measurement via Doppler interferometer

AU - Wilson, David J.

AU - Craven, Charles E.

AU - Snyder, Donald R.

AU - Hopkins, Mark F.

AU - Chipman, Russell A.

AU - Hodgson, Randall R.

PY - 1990/1/25

Y1 - 1990/1/25

N2 - Pitch and yaw of objects moving at high velocities can be measured with a Doppler interferometer system employing corner cube retroreflectors mounted on the moving object. Measurement of pitch or yaw alone was demonstrated in laboratory and field experiments. Using the Jones calculus, the polarization considerations for measuring both pitch and yaw simultaneously have been analyzed.

AB - Pitch and yaw of objects moving at high velocities can be measured with a Doppler interferometer system employing corner cube retroreflectors mounted on the moving object. Measurement of pitch or yaw alone was demonstrated in laboratory and field experiments. Using the Jones calculus, the polarization considerations for measuring both pitch and yaw simultaneously have been analyzed.

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U2 - 10.1117/12.962922

DO - 10.1117/12.962922

M3 - Conference article

AN - SCOPUS:85075445075

SN - 0277-786X

VL - 1166

SP - 503

EP - 517

JO - Proceedings of SPIE - The International Society for Optical Engineering

JF - Proceedings of SPIE - The International Society for Optical Engineering

T2 - Polarization Considerations for Optical Systems II 1989

Y2 - 7 August 1989 through 11 August 1989

ER -

Remote attitude measurement via Doppler interferometer

Abstract

ASJC Scopus subject areas

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