TY - GEN
T1 - Reliability quantification of electronics in the space environment
AU - Wei, Zishan
AU - Ganapol, Barry D.
PY - 2005
Y1 - 2005
N2 - Space environment naturally can damage electronics through two failure mechanisms, totalionizing-dose and single-event effects (SEE). In this presentation, a reliability quantification method is proposed by considering both failure mechanisms, The reliability of an electronic device due to the first failure mechanism is defined as the probability of the cumulative effect of the particles greater than an allowable threshold. The reliability due to the second failure mechanisms is defined as the probability of a high-energy particle impacting the device and causing the hard failure of the electronics. The reliability of the entire device is obtained by using Baye's theory. A cascade model for the cumulative deposited energy of Galactic ions is presented. Finally, a comprehensive example is given to illustrate the usage of the proposed method.
AB - Space environment naturally can damage electronics through two failure mechanisms, totalionizing-dose and single-event effects (SEE). In this presentation, a reliability quantification method is proposed by considering both failure mechanisms, The reliability of an electronic device due to the first failure mechanism is defined as the probability of the cumulative effect of the particles greater than an allowable threshold. The reliability due to the second failure mechanisms is defined as the probability of a high-energy particle impacting the device and causing the hard failure of the electronics. The reliability of the entire device is obtained by using Baye's theory. A cascade model for the cumulative deposited energy of Galactic ions is presented. Finally, a comprehensive example is given to illustrate the usage of the proposed method.
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M3 - Conference contribution
AN - SCOPUS:27844603731
SN - 0894486969
SN - 9780894486968
T3 - American Nuclear Society Embedded Topical Meeting - 2005 Space Nuclear Conference
SP - 626
EP - 634
BT - American Nuclear Society Embedded Topical Meeting - 2005 Space Nuclear Conference
T2 - American Nuclear Society Embedded Topical Meeting - 2005 Space Nuclear Conference
Y2 - 5 June 2005 through 9 June 2005
ER -