Reliability of memories built from unreliable components under data-dependent gate failures

Keyphrases

• Low-density Parity-check Codes 100%
• Gate Failure 100%
• Data Dependency 100%
• Unreliable Components 100%
• Logic Gates 50%
• Fault Tolerance 50%
• Memory Architecture 50%
• Code Size 50%
• Tanner Graph 50%
• Memory Content 50%
• Component Failure 50%
• Reliability Information 50%
• Expander 50%
• Bit-Flipping Decoder 50%

Computer Science

• Memory Content 100%
• Component Failure 100%