@inproceedings{563dcd92b7484fe28674629b087a5a2a,
title = "Refractive optics metrology using on-axis deflectometry system",
abstract = "An on-axis deflectometry method for measurement of refractive optics is proposed and demonstrated. This system measures wavefront error of a refractive unit under test using a camera, monitor and parabolic mirror all aligned on a single axis. In this way light from the monitor reflects from the parabolic mirror into the aperture of the camera. A null configuration is created when there is no test lens under the test setup. The test lens configuration occurs when a lens is inserted between the mirror and the aperture of the camera. The displacement of image locations of spots displayed on the monitor is analyzed to calculate the wavefront error of the test lens. The system concept is described, the system was built and described, and the procedure was explained along with the reported wavefront error in terms of the first 11 Zernike terms. The test lens position tolerance was evaluated to have +/- 0.13 Diopter accuracy test result.",
keywords = "deflectometry, metrology, on-axis, optical testing, spectacle lens",
author = "Rebecca Su and Heejoo Choi and Daewook Kim",
note = "Publisher Copyright: {\textcopyright} 2024 SPIE.; Optical Manufacturing and Testing 2024 ; Conference date: 20-08-2024 Through 22-08-2024",
year = "2024",
doi = "10.1117/12.3027817",
language = "English (US)",
series = "Proceedings of SPIE - The International Society for Optical Engineering",
publisher = "SPIE",
editor = "Daewook Kim and Heejoo Choi and Heidi Ottevaere",
booktitle = "Optical Manufacturing and Testing 2024",
}