Recovering simulated planet and disk signals using SCALES aperture masking

Mackenzie R. Lach, Steph Sallum, Ravinder Banyal, Natalie Batalha, Geoff Blake, Tim Brandt, Zackery Briesemeister, Aditi Desai, Josh Eisner, Wen Fai Fong, Tom Greene, Mitsuhiko Honda, Isabel Kain, Charlie Kilpatrick, Katherine de Kleer, Michael Liu, Bruce Macintosh, Raquel Martinez, Dimitri Mawet, Brittany MilesCaroline Morley, Imke de Pater, Diana Powell, Patrick Sheehan, Andrew Skemer, Justin Spilker, Deno Stelter, Jordan Stone, Arun Surya, Sivarani Thirupathi, Kevin Wagner, Yifan Zhou

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

The Slicer Combined with Array of Lenslets for Exoplanet Spectroscopy (SCALES) instrument is a lenslet-based integral field spectrograph that will operate at 2 to 5 microns, imaging and characterizing colder (and thus older) planets than current high-contrast instruments. Its spatial resolution for distant science targets and/or close-in disks and companions could be improved via interferometric techniques such as sparse aperture masking. We introduce a nascent Python package, NRM-artist, that we use to design several SCALES masks to be nonredundant and to have uniform coverage in Fourier space. We generate high-fidelity mock SCALES data using the scalessim package for SCALES’ low spectral resolution modes across its 2 to 5 micron bandpass. We include realistic noise from astrophysical and instrument sources, including Keck adaptive optics and Poisson noise. We inject planet and disk signals into the mock datasets and subsequently recover them to test the performance of SCALES sparse aperture masking and to determine the sensitivity of various mask designs to different science signals.

Original languageEnglish (US)
Title of host publicationTechniques and Instrumentation for Detection of Exoplanets XI
EditorsGarreth J. Ruane
PublisherSPIE
ISBN (Electronic)9781510665743
DOIs
StatePublished - 2023
EventTechniques and Instrumentation for Detection of Exoplanets XI 2023 - San Diego, United States
Duration: Aug 21 2023Aug 24 2023

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume12680
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceTechniques and Instrumentation for Detection of Exoplanets XI 2023
Country/TerritoryUnited States
CitySan Diego
Period8/21/238/24/23

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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