Reconfigurable dynamic optical system design, test, and data analysis

Dae Wook Kim; Maham Aftab; Isaac Trumper; Logan Graves; Henry Quach; Hyukmo Kang; Hyemin Yoo; Andrew Lowman; Greg Smith; Matt Dubin; Chang Jin Oh; Justin Hyatt; Christian Davila-Peralta; Heejoo Choi

doi:10.1117/12.2555650

Reconfigurable dynamic optical system design, test, and data analysis

Dae Wook Kim, Maham Aftab, Isaac Trumper, Logan Graves, Henry Quach, Hyukmo Kang, Hyemin Yoo, Andrew Lowman, Greg Smith, Matt Dubin, Chang Jin Oh, Justin Hyatt, Christian Davila-Peralta, Heejoo Choi

Optical Sciences

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

1 Scopus citations

Abstract

Reconfigurable freeform optical systems enable greatly enhanced imaging and focusing performance within non-symmetric, compact, and ergonomic form factors. In this paper, several improvements are presented for the design, test, and data analysis with these systems. Specific improvements include definition of a modal G and C vector basis set based on Chebyshev polynomials for the design and analysis of non-circular optical systems. This framework is then incorporated into a parametric optimization process and tested with the Tomographic Ionized-carbon Mapping Experiment (TIME), a reconfigurable optical system. Beyond design, a reconfigurable deflectometry system enhances metrology to measure a fast, f/1.26 convex optic as well as an Alvarez lens. Further improvements in an infrared deflectometry system show accuracy around /10 of the notoriously difficult low-order power. Working together, the mathematical vector polynomial set, the programmatic optical design approach, and various deflectometry-based optical testing technologies enable more flexible and optimal utilization of freeform optical components and design configurations.

Original language	English (US)
Title of host publication	Optics and Photonics for Advanced Dimensional Metrology
Editors	Peter J. de Groot, Richard K. Leach, Pascal Picart
Publisher	SPIE
ISBN (Electronic)	9781510634763
DOIs	https://doi.org/10.1117/12.2555650
State	Published - 2020
Event	Optics and Photonics for Advanced Dimensional Metrology 2020 - Virtual, Online, France Duration: Apr 6 2020 → Apr 10 2020

Publication series

Name	Proceedings of SPIE - The International Society for Optical Engineering
Volume	11352
ISSN (Print)	0277-786X
ISSN (Electronic)	1996-756X

Conference

Conference	Optics and Photonics for Advanced Dimensional Metrology 2020
Country/Territory	France
City	Virtual, Online
Period	4/6/20 → 4/10/20

Keywords

C Polynomials
Deflectometry
Fitness Function
Freeform optics
G Polynomials
Infrared Deflectometry
Parametric Optimization
Vector Polynomials

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Computer Science Applications
Applied Mathematics
Electrical and Electronic Engineering

Access to Document

10.1117/12.2555650

Cite this

Kim, D. W., Aftab, M., Trumper, I., Graves, L., Quach, H., Kang, H., Yoo, H., Lowman, A., Smith, G., Dubin, M., Oh, C. J., Hyatt, J., Davila-Peralta, C., & Choi, H. (2020). Reconfigurable dynamic optical system design, test, and data analysis. In P. J. de Groot, R. K. Leach, & P. Picart (Eds.), Optics and Photonics for Advanced Dimensional Metrology Article 1135202 (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 11352). SPIE. https://doi.org/10.1117/12.2555650

Reconfigurable dynamic optical system design, test, and data analysis. / Kim, Dae Wook; Aftab, Maham; Trumper, Isaac et al.
Optics and Photonics for Advanced Dimensional Metrology. ed. / Peter J. de Groot; Richard K. Leach; Pascal Picart. SPIE, 2020. 1135202 (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 11352).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Kim, DW, Aftab, M, Trumper, I, Graves, L, Quach, H, Kang, H, Yoo, H, Lowman, A, Smith, G , Dubin, M , Oh, CJ, Hyatt, J, Davila-Peralta, C & Choi, H 2020, Reconfigurable dynamic optical system design, test, and data analysis. in PJ de Groot, RK Leach & P Picart (eds), Optics and Photonics for Advanced Dimensional Metrology., 1135202, Proceedings of SPIE - The International Society for Optical Engineering, vol. 11352, SPIE, Optics and Photonics for Advanced Dimensional Metrology 2020, Virtual, Online, France, 4/6/20. https://doi.org/10.1117/12.2555650

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Reconfigurable dynamic optical system design, test, and data analysis

Abstract

Publication series

Conference

Keywords

ASJC Scopus subject areas

Access to Document

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