Read-noise characterization of focal plane array detectors via mean-variance analysis

R. P. Sperline; A. K. Knight; C. A. Gresham; D. W. Koppenaal; G. M. Hieftje; M. B. Denton

doi:10.1366/000370205774783250

Read-noise characterization of focal plane array detectors via mean-variance analysis

R. P. Sperline, A. K. Knight, C. A. Gresham, D. W. Koppenaal, G. M. Hieftje, M. B. Denton

Research output: Contribution to journal › Article › peer-review

14 Scopus citations

Abstract

Mean-variance analysis is described as a method for characterization of the read-noise and gain of focal plane array (FPA) detectors, including charge-coupled devices (CCDs), charge-injection devices (CIDs), and complementary metal-oxide-semiconductor (CMOS) multiplexers (infrared arrays). Practical FPA detector characterization is outlined. The nondestructive readout capability available in some CIDs and FPA devices is discussed as a means for signal-to-noise ratio improvement. Derivations of the equations are fully presented to unify understanding of this method by the spectroscopic community.

Original language	English (US)
Pages (from-to)	1315-1323
Number of pages	9
Journal	Applied Spectroscopy
Volume	59
Issue number	11
DOIs	https://doi.org/10.1366/000370205774783250
State	Published - Nov 2005
Externally published	Yes

Keywords

CCD
CID
CMOS multiplexer
Charge-coupled device
Charge-injection device
Complementary metal-oxide-semiconductor multiplexer
FPA
Focal plane array
Mean-variance analysis
Poisson distribution

ASJC Scopus subject areas

Instrumentation
Spectroscopy

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10.1366/000370205774783250

Cite this

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title = "Read-noise characterization of focal plane array detectors via mean-variance analysis",

abstract = "Mean-variance analysis is described as a method for characterization of the read-noise and gain of focal plane array (FPA) detectors, including charge-coupled devices (CCDs), charge-injection devices (CIDs), and complementary metal-oxide-semiconductor (CMOS) multiplexers (infrared arrays). Practical FPA detector characterization is outlined. The nondestructive readout capability available in some CIDs and FPA devices is discussed as a means for signal-to-noise ratio improvement. Derivations of the equations are fully presented to unify understanding of this method by the spectroscopic community.",

keywords = "CCD, CID, CMOS multiplexer, Charge-coupled device, Charge-injection device, Complementary metal-oxide-semiconductor multiplexer, FPA, Focal plane array, Mean-variance analysis, Poisson distribution",

author = "Sperline, {R. P.} and Knight, {A. K.} and Gresham, {C. A.} and Koppenaal, {D. W.} and Hieftje, {G. M.} and Denton, {M. B.}",

year = "2005",

month = nov,

doi = "10.1366/000370205774783250",

language = "English (US)",

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publisher = "Society for Applied Spectroscopy",

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AU - Sperline, R. P.

AU - Knight, A. K.

AU - Gresham, C. A.

AU - Koppenaal, D. W.

AU - Hieftje, G. M.

AU - Denton, M. B.

PY - 2005/11

Y1 - 2005/11

N2 - Mean-variance analysis is described as a method for characterization of the read-noise and gain of focal plane array (FPA) detectors, including charge-coupled devices (CCDs), charge-injection devices (CIDs), and complementary metal-oxide-semiconductor (CMOS) multiplexers (infrared arrays). Practical FPA detector characterization is outlined. The nondestructive readout capability available in some CIDs and FPA devices is discussed as a means for signal-to-noise ratio improvement. Derivations of the equations are fully presented to unify understanding of this method by the spectroscopic community.

AB - Mean-variance analysis is described as a method for characterization of the read-noise and gain of focal plane array (FPA) detectors, including charge-coupled devices (CCDs), charge-injection devices (CIDs), and complementary metal-oxide-semiconductor (CMOS) multiplexers (infrared arrays). Practical FPA detector characterization is outlined. The nondestructive readout capability available in some CIDs and FPA devices is discussed as a means for signal-to-noise ratio improvement. Derivations of the equations are fully presented to unify understanding of this method by the spectroscopic community.

KW - CCD

KW - CID

KW - CMOS multiplexer

KW - Charge-coupled device

KW - Charge-injection device

KW - Complementary metal-oxide-semiconductor multiplexer

KW - FPA

KW - Focal plane array

KW - Mean-variance analysis

KW - Poisson distribution

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Read-noise characterization of focal plane array detectors via mean-variance analysis

Abstract

Keywords

ASJC Scopus subject areas

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