Ray tracing in biaxial materials

Wai Sze T. Lam, Stephen McClain, Greg A. Smith, Russell Chipman

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Scopus citations


Algorithms for polarization ray tracing biaxial materials and calculating the directions of ray propagation and energy flow, the refractive indices, and the coupling coefficients for all four resultant reflected and transmitted rays are presented. Examples of polarization state maps, retardance maps and diattenuation maps are generated as a function of angle of incidence for comparing plane parallel plate systems with uniaxial and biaxial materials.

Original languageEnglish (US)
Title of host publicationInternational Optical Design Conference 2010
StatePublished - 2010
EventInternational Optical Design Conference 2010 - Jackson Hole, WY, United States
Duration: Jun 13 2010Jun 17 2010

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
ISSN (Print)0277-786X


OtherInternational Optical Design Conference 2010
Country/TerritoryUnited States
CityJackson Hole, WY


  • Polarization ray tracing
  • biaxial materials
  • birefringent material

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering


Dive into the research topics of 'Ray tracing in biaxial materials'. Together they form a unique fingerprint.

Cite this