Pulse timing optimization of II-IV direct type semiconductor detectors for flat-panel pulsed X-ray imaging

G. C. Giakos; R. Guntupalli; J. Odogba; N. Shah; S. Vedantham; S. Suryanarayanan; S. Chowdhury; A. G. Passerini; R. Nemer; K. Mehta; S. Sumrain; N. Patnekar; M. Sridhar; Fabrizio Russo

Pulse timing optimization of II-IV direct type semiconductor detectors for flat-panel pulsed X-ray imaging

G. C. Giakos, R. Guntupalli, J. Odogba, N. Shah, S. Vedantham, S. Suryanarayanan, S. Chowdhury, A. G. Passerini, R. Nemer, K. Mehta, S. Sumrain, N. Patnekar, M. Sridhar, Fabrizio Russo

Research output: Contribution to conference › Paper › peer-review

Abstract

The rising and falling edges of detected signal pulses have been measured utilizing X-ray ionization of a planar Cd_1-xZn_xTe system under different irradiation geometries. The results indicate that the time response of the CdZnTe based X-ray system is suitable for digital fluoroscopic applications. Enhanced timing characteristics can be obtained by optimizing the detector transport characteristics.

Original language	English (US)
Pages	1248-1252
Number of pages	5
State	Published - 2000
Externally published	Yes
Event	IMTC/2000 - 17th IEEE Instrumentation and Measurement Technology Conference 'Smart Connectivity: Integrating Measurement and Control' - Baltimore, MD, USA Duration: May 1 2000 → May 4 2000

Conference

Conference	IMTC/2000 - 17th IEEE Instrumentation and Measurement Technology Conference 'Smart Connectivity: Integrating Measurement and Control'
City	Baltimore, MD, USA
Period	5/1/00 → 5/4/00

ASJC Scopus subject areas

Electrical and Electronic Engineering

Cite this

Giakos, G. C., Guntupalli, R., Odogba, J., Shah, N., Vedantham, S., Suryanarayanan, S., Chowdhury, S., Passerini, A. G., Nemer, R., Mehta, K., Sumrain, S., Patnekar, N., Sridhar, M., & Russo, F. (2000). Pulse timing optimization of II-IV direct type semiconductor detectors for flat-panel pulsed X-ray imaging. 1248-1252. Paper presented at IMTC/2000 - 17th IEEE Instrumentation and Measurement Technology Conference 'Smart Connectivity: Integrating Measurement and Control', Baltimore, MD, USA.

Pulse timing optimization of II-IV direct type semiconductor detectors for flat-panel pulsed X-ray imaging. / Giakos, G. C.; Guntupalli, R.; Odogba, J. et al.
2000. 1248-1252 Paper presented at IMTC/2000 - 17th IEEE Instrumentation and Measurement Technology Conference 'Smart Connectivity: Integrating Measurement and Control', Baltimore, MD, USA.

Research output: Contribution to conference › Paper › peer-review

Giakos, GC, Guntupalli, R, Odogba, J, Shah, N, Vedantham, S, Suryanarayanan, S, Chowdhury, S, Passerini, AG, Nemer, R, Mehta, K, Sumrain, S, Patnekar, N, Sridhar, M & Russo, F 2000, 'Pulse timing optimization of II-IV direct type semiconductor detectors for flat-panel pulsed X-ray imaging', Paper presented at IMTC/2000 - 17th IEEE Instrumentation and Measurement Technology Conference 'Smart Connectivity: Integrating Measurement and Control', Baltimore, MD, USA, 5/1/00 - 5/4/00 pp. 1248-1252.

@conference{aaa87f09aa934e3cb9e9633f3404aaaf,

title = "Pulse timing optimization of II-IV direct type semiconductor detectors for flat-panel pulsed X-ray imaging",

abstract = "The rising and falling edges of detected signal pulses have been measured utilizing X-ray ionization of a planar Cd1-xZnxTe system under different irradiation geometries. The results indicate that the time response of the CdZnTe based X-ray system is suitable for digital fluoroscopic applications. Enhanced timing characteristics can be obtained by optimizing the detector transport characteristics.",

author = "Giakos, \{G. C.\} and R. Guntupalli and J. Odogba and N. Shah and S. Vedantham and S. Suryanarayanan and S. Chowdhury and Passerini, \{A. G.\} and R. Nemer and K. Mehta and S. Sumrain and N. Patnekar and M. Sridhar and Fabrizio Russo",

year = "2000",

language = "English (US)",

pages = "1248--1252",

note = "IMTC/2000 - 17th IEEE Instrumentation and Measurement Technology Conference 'Smart Connectivity: Integrating Measurement and Control' ; Conference date: 01-05-2000 Through 04-05-2000",

}

TY - CONF

T1 - Pulse timing optimization of II-IV direct type semiconductor detectors for flat-panel pulsed X-ray imaging

AU - Giakos, G. C.

AU - Guntupalli, R.

AU - Odogba, J.

AU - Shah, N.

AU - Vedantham, S.

AU - Suryanarayanan, S.

AU - Chowdhury, S.

AU - Passerini, A. G.

AU - Nemer, R.

AU - Mehta, K.

AU - Sumrain, S.

AU - Patnekar, N.

AU - Sridhar, M.

AU - Russo, Fabrizio

PY - 2000

Y1 - 2000

N2 - The rising and falling edges of detected signal pulses have been measured utilizing X-ray ionization of a planar Cd1-xZnxTe system under different irradiation geometries. The results indicate that the time response of the CdZnTe based X-ray system is suitable for digital fluoroscopic applications. Enhanced timing characteristics can be obtained by optimizing the detector transport characteristics.

AB - The rising and falling edges of detected signal pulses have been measured utilizing X-ray ionization of a planar Cd1-xZnxTe system under different irradiation geometries. The results indicate that the time response of the CdZnTe based X-ray system is suitable for digital fluoroscopic applications. Enhanced timing characteristics can be obtained by optimizing the detector transport characteristics.

UR - https://www.scopus.com/pages/publications/0033725954

UR - https://www.scopus.com/inward/citedby.url?scp=0033725954&partnerID=8YFLogxK

M3 - Paper

AN - SCOPUS:0033725954

SP - 1248

EP - 1252

T2 - IMTC/2000 - 17th IEEE Instrumentation and Measurement Technology Conference 'Smart Connectivity: Integrating Measurement and Control'

Y2 - 1 May 2000 through 4 May 2000

ER -

Pulse timing optimization of II-IV direct type semiconductor detectors for flat-panel pulsed X-ray imaging

Abstract

Conference

ASJC Scopus subject areas

Other files and links

Fingerprint

Cite this