TY - GEN
T1 - Progress in polarization ray tracing
AU - Chipman, Russell A.
PY - 1994
Y1 - 1994
N2 - Polarization ray tracing is a collection of methods that extend geometrical ray tracing allowing the calculation of the evolution of polarization states along ray paths and the determination of the intrinsic polarization properties, such as diattenuation and retardance, associated with ray paths. This paper compares the suitability of the Jones, Mueller, and 3D polarization ray tracing calculi, examining the issues of local vs. global coordinates, amplitude vs. phase representations, inclusion of the wavefront aberration function, partially polarized light, measurements of images by polarimeters, and diffraction image formation by low and high numerical aperture beams.
AB - Polarization ray tracing is a collection of methods that extend geometrical ray tracing allowing the calculation of the evolution of polarization states along ray paths and the determination of the intrinsic polarization properties, such as diattenuation and retardance, associated with ray paths. This paper compares the suitability of the Jones, Mueller, and 3D polarization ray tracing calculi, examining the issues of local vs. global coordinates, amplitude vs. phase representations, inclusion of the wavefront aberration function, partially polarized light, measurements of images by polarimeters, and diffraction image formation by low and high numerical aperture beams.
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M3 - Conference contribution
AN - SCOPUS:0028748274
SN - 0819415898
T3 - Proceedings of SPIE - The International Society for Optical Engineering
SP - 141
EP - 151
BT - Proceedings of SPIE - The International Society for Optical Engineering
A2 - Goldstein, Dennis H.
A2 - Chenault, David B.
PB - Society of Photo-Optical Instrumentation Engineers
T2 - Polarization Analysis and Measurement II
Y2 - 25 July 1994 through 27 July 1994
ER -