Progress in polarization ray tracing

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Scopus citations


Polarization ray tracing is a collection of methods that extend geometrical ray tracing allowing the calculation of the evolution of polarization states along ray paths and the determination of the intrinsic polarization properties, such as diattenuation and retardance, associated with ray paths. This paper compares the suitability of the Jones, Mueller, and 3D polarization ray tracing calculi, examining the issues of local vs. global coordinates, amplitude vs. phase representations, inclusion of the wavefront aberration function, partially polarized light, measurements of images by polarimeters, and diffraction image formation by low and high numerical aperture beams.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
EditorsDennis H. Goldstein, David B. Chenault
PublisherSociety of Photo-Optical Instrumentation Engineers
Number of pages11
ISBN (Print)0819415898
StatePublished - 1994
EventPolarization Analysis and Measurement II - San Diego, CA, USA
Duration: Jul 25 1994Jul 27 1994

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
ISSN (Print)0277-786X


OtherPolarization Analysis and Measurement II
CitySan Diego, CA, USA

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering


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