Original language | English (US) |
---|---|
Pages (from-to) | ix |
Journal | Proceedings of SPIE - The International Society for Optical Engineering |
Volume | 3121 |
State | Published - 1997 |
Externally published | Yes |
Event | Polarization: Measurement, Analysis, and Remote Sensing - San Diego, CA, United States Duration: Jul 30 1997 → Aug 1 1997 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Computer Science Applications
- Applied Mathematics
- Electrical and Electronic Engineering