Probing of basal planes of MoS2 by scanning tunneling microscopy

Dror Sarid, Tammy D. Henson, Neal R. Armstrong, L. Stephen Bell

Research output: Contribution to journalArticlepeer-review

27 Scopus citations


Atomically resolved images of MoS2 have been obtained using scanning tunneling microscopy with both positively and negatively biased samples yielding the hexagonal symmetry of the surface of the crystal. Also measured were curves of tunneling current as a function of bias voltage, from which the density of states of the valence and conduction bands can be inferred.

Original languageEnglish (US)
Pages (from-to)2252-2254
Number of pages3
JournalApplied Physics Letters
Issue number26
StatePublished - 1988
Externally publishedYes

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)


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