Probing of basal planes of MoS2 by scanning tunneling microscopy

Dror Sarid; Tammy D. Henson; Neal R. Armstrong; L. Stephen Bell

doi:10.1063/1.99769

Probing of basal planes of MoS₂ by scanning tunneling microscopy

Dror Sarid, Tammy D. Henson, Neal R. Armstrong, L. Stephen Bell

Research output: Contribution to journal › Article › peer-review

27 Scopus citations

Abstract

Atomically resolved images of MoS₂ have been obtained using scanning tunneling microscopy with both positively and negatively biased samples yielding the hexagonal symmetry of the surface of the crystal. Also measured were curves of tunneling current as a function of bias voltage, from which the density of states of the valence and conduction bands can be inferred.

Original language	English (US)
Pages (from-to)	2252-2254
Number of pages	3
Journal	Applied Physics Letters
Volume	52
Issue number	26
DOIs	https://doi.org/10.1063/1.99769
State	Published - 1988
Externally published	Yes

ASJC Scopus subject areas

Physics and Astronomy (miscellaneous)

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title = "Probing of basal planes of MoS2 by scanning tunneling microscopy",

abstract = "Atomically resolved images of MoS2 have been obtained using scanning tunneling microscopy with both positively and negatively biased samples yielding the hexagonal symmetry of the surface of the crystal. Also measured were curves of tunneling current as a function of bias voltage, from which the density of states of the valence and conduction bands can be inferred.",

author = "Dror Sarid and Henson, {Tammy D.} and Armstrong, {Neal R.} and Bell, {L. Stephen}",

year = "1988",

doi = "10.1063/1.99769",

language = "English (US)",

volume = "52",

pages = "2252--2254",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics Publising LLC",

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T1 - Probing of basal planes of MoS2 by scanning tunneling microscopy

AU - Sarid, Dror

AU - Henson, Tammy D.

AU - Armstrong, Neal R.

AU - Bell, L. Stephen

PY - 1988

Y1 - 1988

N2 - Atomically resolved images of MoS2 have been obtained using scanning tunneling microscopy with both positively and negatively biased samples yielding the hexagonal symmetry of the surface of the crystal. Also measured were curves of tunneling current as a function of bias voltage, from which the density of states of the valence and conduction bands can be inferred.

AB - Atomically resolved images of MoS2 have been obtained using scanning tunneling microscopy with both positively and negatively biased samples yielding the hexagonal symmetry of the surface of the crystal. Also measured were curves of tunneling current as a function of bias voltage, from which the density of states of the valence and conduction bands can be inferred.

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U2 - 10.1063/1.99769

DO - 10.1063/1.99769

M3 - Article

AN - SCOPUS:0347028931

SN - 0003-6951

VL - 52

SP - 2252

EP - 2254

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 26

ER -

Probing of basal planes of MoS₂ by scanning tunneling microscopy

Abstract

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