TY - GEN
T1 - Principle hessian direction based parameter reduction with process variation
AU - Mitev, Alex
AU - Marefat, Michael
AU - Ma, Dongsheng
AU - Wang, Janet M.
PY - 2007
Y1 - 2007
N2 - As CMOS technology enters the nanometer regime, the increasing process variation is bringing manifest impact on circuit performance. In this paper, we propose a Principle Hessian Direction (PHD) based parameter reduction approach. This new approach relies on the impact of each parameter on circuit performance to decide whether keeping or reducing the parameter. Compared with the existing principle component analysis (PCA) method, this performance based property provides us a significantly smaller set of parameters after reduction. The experimental results also support our conclusions. In all cases, an average of 53% of reduction is observed with less than 3% error in the mean value and less than 8% error in the variation.
AB - As CMOS technology enters the nanometer regime, the increasing process variation is bringing manifest impact on circuit performance. In this paper, we propose a Principle Hessian Direction (PHD) based parameter reduction approach. This new approach relies on the impact of each parameter on circuit performance to decide whether keeping or reducing the parameter. Compared with the existing principle component analysis (PCA) method, this performance based property provides us a significantly smaller set of parameters after reduction. The experimental results also support our conclusions. In all cases, an average of 53% of reduction is observed with less than 3% error in the mean value and less than 8% error in the variation.
UR - http://www.scopus.com/inward/record.url?scp=50249147886&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=50249147886&partnerID=8YFLogxK
U2 - 10.1109/ICCAD.2007.4397336
DO - 10.1109/ICCAD.2007.4397336
M3 - Conference contribution
AN - SCOPUS:50249147886
SN - 1424413826
SN - 9781424413829
T3 - IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD
SP - 632
EP - 637
BT - 2007 IEEE/ACM International Conference on Computer-Aided Design, ICCAD
T2 - 2007 IEEE/ACM International Conference on Computer-Aided Design, ICCAD
Y2 - 4 November 2007 through 8 November 2007
ER -