@inproceedings{e654c668ecd040f9a1731e56de0afc72,
title = "Preliminary Investigation to Improve Point Spread Function Modeling for a Multi-Pinhole SPECT Camera",
abstract = "Herein we report on the mathematical modeling of the simulated point spread functions (PSFs) of pinhole apertures for clinical I-123 DaTscan imaging on a dual-head SPECT system consisting of fan and multi-pinhole (MPH) collimators on separate heads. The PSFs can be measured sparsely by translating a point source within the volume of interest (VOI). These PSFs were generated using GATE Monte Carlo simulation software and were then modeled using standard 2D Gaussian having 6 parameters, and three other models using higher order polynomial terms as well as cross terms in the exponential. The goal is to efficiently store the parameters of the modeled PSF, measured across the VOI and then interpolate them on the fly during reconstruction. It has been shown that MPH reconstruction can be improved with accurate modeling of the PSF. However, for our application it has been determined that improved accuracy in PSF modeling (reduced NRMSE) can be obtained by incorporating more polynomial terms in the exponential than employed by the standard 2D Gaussian, especially with increased pinhole angulations. In this paper we introduce higher order polynomial terms (degree 3 and 4) as an extension to the Gaussian model and observe that these added terms could significantly reduce the NRMSE.",
keywords = "-SPECT, DaTscan, Gaussian, Gaussian CC4., GaussianC, GaussianCC, Multi-pinhole (MPH), Point Spread Function (PSF)",
author = "Soumyanil Banerjee and Arda Konik and Mukherjee, {Joyeeta M.} and Kalluri, {Kesava S.} and Goding, {Justin C.} and Luca Caucci and Zubal, {George I.} and Furenlid, {Lars R.} and King, {Michael A.}",
note = "Publisher Copyright: {\textcopyright} 2017 IEEE.; 2017 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2017 ; Conference date: 21-10-2017 Through 28-10-2017",
year = "2018",
month = nov,
day = "12",
doi = "10.1109/NSSMIC.2017.8532750",
language = "English (US)",
series = "2017 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2017 - Conference Proceedings",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
booktitle = "2017 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2017 - Conference Proceedings",
}