Precision polarimetry of optical components

Russell A. Chipman

doi:10.1117/12.132143

Precision polarimetry of optical components

Research output: Contribution to journal › Conference article › peer-review

Abstract

Polarization elements at present are inadequately characterized for many applications. For retarders, usually only the retardance is specified. For polarizers, usually only the two principal transmittances or the extinction ratio are given. For polarization elements used in critical applications, this level of characterization is woefully inadequate. Defects of polarization elements will be described, and appropriate performance measures suggested. Examples of the characterization of polarization elements as a function of angle of incidence, and as a function of wavelength are provided.

Original language	English (US)
Pages (from-to)	325-335
Number of pages	11
Journal	Proceedings of SPIE - The International Society for Optical Engineering
Volume	1720
DOIs	https://doi.org/10.1117/12.132143
State	Published - 1992
Externally published	Yes
Event	International Symposium on Optical Fabrication, Testing, and Surface Evaluation 1992 - Tokyo, Japan Duration: Jun 10 1992 → Jun 12 1992

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Computer Science Applications
Applied Mathematics
Electrical and Electronic Engineering

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10.1117/12.132143

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title = "Precision polarimetry of optical components",

abstract = "Polarization elements at present are inadequately characterized for many applications. For retarders, usually only the retardance is specified. For polarizers, usually only the two principal transmittances or the extinction ratio are given. For polarization elements used in critical applications, this level of characterization is woefully inadequate. Defects of polarization elements will be described, and appropriate performance measures suggested. Examples of the characterization of polarization elements as a function of angle of incidence, and as a function of wavelength are provided.",

author = "Chipman, {Russell A.}",

note = "Funding Information: I wish to acknowledge the contributions of my colleagues David Chenault and J. Larry Pezzaniti to this work. Portions of this research were supported by the Air Force Office of Scientific Research Publisher Copyright: {\textcopyright} 1992 SPIE. All rights reserved.; International Symposium on Optical Fabrication, Testing, and Surface Evaluation 1992 ; Conference date: 10-06-1992 Through 12-06-1992",

year = "1992",

doi = "10.1117/12.132143",

language = "English (US)",

volume = "1720",

pages = "325--335",

journal = "Proceedings of SPIE - The International Society for Optical Engineering",

issn = "0277-786X",

publisher = "SPIE",

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TY - JOUR

T1 - Precision polarimetry of optical components

AU - Chipman, Russell A.

N1 - Funding Information: I wish to acknowledge the contributions of my colleagues David Chenault and J. Larry Pezzaniti to this work. Portions of this research were supported by the Air Force Office of Scientific Research Publisher Copyright: © 1992 SPIE. All rights reserved.

PY - 1992

Y1 - 1992

N2 - Polarization elements at present are inadequately characterized for many applications. For retarders, usually only the retardance is specified. For polarizers, usually only the two principal transmittances or the extinction ratio are given. For polarization elements used in critical applications, this level of characterization is woefully inadequate. Defects of polarization elements will be described, and appropriate performance measures suggested. Examples of the characterization of polarization elements as a function of angle of incidence, and as a function of wavelength are provided.

AB - Polarization elements at present are inadequately characterized for many applications. For retarders, usually only the retardance is specified. For polarizers, usually only the two principal transmittances or the extinction ratio are given. For polarization elements used in critical applications, this level of characterization is woefully inadequate. Defects of polarization elements will be described, and appropriate performance measures suggested. Examples of the characterization of polarization elements as a function of angle of incidence, and as a function of wavelength are provided.

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DO - 10.1117/12.132143

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AN - SCOPUS:85075709994

SN - 0277-786X

VL - 1720

SP - 325

EP - 335

JO - Proceedings of SPIE - The International Society for Optical Engineering

JF - Proceedings of SPIE - The International Society for Optical Engineering

T2 - International Symposium on Optical Fabrication, Testing, and Surface Evaluation 1992

Y2 - 10 June 1992 through 12 June 1992

ER -

Precision polarimetry of optical components

Abstract

ASJC Scopus subject areas

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