Polarization signatures of spherical and conical targets measured by Mueller matrix imaging polarimetry

Pierre Yves Gerligand, Russell A. Chipman, Elizabeth A. Sornsin, Matthew H. Smith

Research output: Contribution to journalConference articlepeer-review

17 Scopus citations


The polarization and depolarization properties of two types of targets (spherical and conical targets) have been derived from the experimental determination of their Muller matrix image. Each polarization signature is deduced from the polar decomposition of the Mueller matrix into images of retardance, diattenuation, polarizance, and depolarization. Different correlations between the polarization parameters and synthesized angle of incidence and angle of scatter images have been developed to determine an approximation of the angle of incidence from the polarization signatures.

Original languageEnglish (US)
Pages (from-to)63-73
Number of pages11
JournalProceedings of SPIE - The International Society for Optical Engineering
StatePublished - 1997
EventPolarization: Measurement, Analysis, and Remote Sensing - San Diego, CA, United States
Duration: Jul 30 1997Aug 1 1997


  • Depolarization
  • Diattenuation
  • Mueller matrix
  • Polarimetry
  • Polarization signature
  • Retardance

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering


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