Polarization signatures of spherical and conical targets measured by Mueller matrix imaging polarimetry

Pierre Yves Gerligand; Russell A. Chipman; Elizabeth A. Sornsin; Matthew H. Smith

doi:10.1117/12.278987

Polarization signatures of spherical and conical targets measured by Mueller matrix imaging polarimetry

Pierre Yves Gerligand, Russell A. Chipman, Elizabeth A. Sornsin, Matthew H. Smith

Research output: Contribution to journal › Conference article › peer-review

17 Scopus citations

Abstract

The polarization and depolarization properties of two types of targets (spherical and conical targets) have been derived from the experimental determination of their Muller matrix image. Each polarization signature is deduced from the polar decomposition of the Mueller matrix into images of retardance, diattenuation, polarizance, and depolarization. Different correlations between the polarization parameters and synthesized angle of incidence and angle of scatter images have been developed to determine an approximation of the angle of incidence from the polarization signatures.

Original language	English (US)
Pages (from-to)	63-73
Number of pages	11
Journal	Proceedings of SPIE - The International Society for Optical Engineering
Volume	3121
DOIs	https://doi.org/10.1117/12.278987
State	Published - 1997
Externally published	Yes
Event	Polarization: Measurement, Analysis, and Remote Sensing - San Diego, CA, United States Duration: Jul 30 1997 → Aug 1 1997

Keywords

Depolarization
Diattenuation
Mueller matrix
Polarimetry
Polarization signature
Retardance

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Computer Science Applications
Applied Mathematics
Electrical and Electronic Engineering

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10.1117/12.278987

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@article{8ee257072cc84c94b5f5528935d28f65,

title = "Polarization signatures of spherical and conical targets measured by Mueller matrix imaging polarimetry",

abstract = "The polarization and depolarization properties of two types of targets (spherical and conical targets) have been derived from the experimental determination of their Muller matrix image. Each polarization signature is deduced from the polar decomposition of the Mueller matrix into images of retardance, diattenuation, polarizance, and depolarization. Different correlations between the polarization parameters and synthesized angle of incidence and angle of scatter images have been developed to determine an approximation of the angle of incidence from the polarization signatures.",

keywords = "Depolarization, Diattenuation, Mueller matrix, Polarimetry, Polarization signature, Retardance",

author = "Gerligand, {Pierre Yves} and Chipman, {Russell A.} and Sornsin, {Elizabeth A.} and Smith, {Matthew H.}",

year = "1997",

doi = "10.1117/12.278987",

language = "English (US)",

volume = "3121",

pages = "63--73",

journal = "Proceedings of SPIE - The International Society for Optical Engineering",

issn = "0277-786X",

publisher = "SPIE",

note = "Polarization: Measurement, Analysis, and Remote Sensing ; Conference date: 30-07-1997 Through 01-08-1997",

}

TY - JOUR

T1 - Polarization signatures of spherical and conical targets measured by Mueller matrix imaging polarimetry

AU - Gerligand, Pierre Yves

AU - Chipman, Russell A.

AU - Sornsin, Elizabeth A.

AU - Smith, Matthew H.

PY - 1997

Y1 - 1997

N2 - The polarization and depolarization properties of two types of targets (spherical and conical targets) have been derived from the experimental determination of their Muller matrix image. Each polarization signature is deduced from the polar decomposition of the Mueller matrix into images of retardance, diattenuation, polarizance, and depolarization. Different correlations between the polarization parameters and synthesized angle of incidence and angle of scatter images have been developed to determine an approximation of the angle of incidence from the polarization signatures.

AB - The polarization and depolarization properties of two types of targets (spherical and conical targets) have been derived from the experimental determination of their Muller matrix image. Each polarization signature is deduced from the polar decomposition of the Mueller matrix into images of retardance, diattenuation, polarizance, and depolarization. Different correlations between the polarization parameters and synthesized angle of incidence and angle of scatter images have been developed to determine an approximation of the angle of incidence from the polarization signatures.

KW - Depolarization

KW - Diattenuation

KW - Mueller matrix

KW - Polarimetry

KW - Polarization signature

KW - Retardance

UR - http://www.scopus.com/inward/record.url?scp=0031288451&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0031288451&partnerID=8YFLogxK

U2 - 10.1117/12.278987

DO - 10.1117/12.278987

M3 - Conference article

AN - SCOPUS:0031288451

SN - 0277-786X

VL - 3121

SP - 63

EP - 73

JO - Proceedings of SPIE - The International Society for Optical Engineering

JF - Proceedings of SPIE - The International Society for Optical Engineering

T2 - Polarization: Measurement, Analysis, and Remote Sensing

Y2 - 30 July 1997 through 1 August 1997

ER -

Polarization signatures of spherical and conical targets measured by Mueller matrix imaging polarimetry

Abstract

Keywords

ASJC Scopus subject areas

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