@inproceedings{87a95322e51f44278efaf9ba0cd9a13b,
title = "Polarization scattering from a Spectralon calibration sample",
abstract = "The in-plane Mueller matrix bidirectional reflectance distribution function (MMBRDF) is measured for a Spectralon calibration target with a reflectance of 99%. Measurements are acquired using a Mueller matrix active imaging, goniometric polarimeter operated in the near infrared at 1550nm. The Spectralon is measured for both incident and scattering angles from -80 degrees to 80 degrees to within 20 degrees of retro-reflection. A range of polarization states is generated and scattered polarization states are analyzed by means of a dual rotating retarder Mueller matrix polarimeter. Complete Mueller matrix data is measured with a high-resolution camera in image form. Polarization scatter data is presented in Mueller matrix angular arrays. As expected the Spectralon is a strong depolarizer and weak s-plane oriented diattenuator. It was also a weak retarder. Diattenuation and retardance are strongest at horizontal and vertical polarizations, and weakest for circular polarization states.",
keywords = "BRDF, Mueller matrix, Polarimetry, Spectralon",
author = "Hannah Noble and Lam, {Wai Sze Tiffany} and Greg Smith and Stephen McClain and Chipman, {Russell A.}",
year = "2007",
doi = "10.1117/12.747483",
language = "English (US)",
isbn = "9780819468307",
series = "Proceedings of SPIE - The International Society for Optical Engineering",
booktitle = "Polarization Science and Remote Sensing III",
note = "Polarization Science and Remote Sensing III ; Conference date: 29-08-2007 Through 30-08-2007",
}