Abstract
A method of polarization ray tracing for calculating the instrumental polarization function of an optical system using the Jones calculus is presented. Polarization ray tracing supplements the equations of ray tracing to include amplitude, phase, polarization and retardance effects of thin films, polarization elements and polarizing materials. Results of a polarization ray trace analysis of a Cassegrain telescope are presented.
Original language | English (US) |
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Pages (from-to) | 61-68 |
Number of pages | 8 |
Journal | Proceedings of SPIE - The International Society for Optical Engineering |
Volume | 766 |
DOIs | |
State | Published - Jun 10 1987 |
Externally published | Yes |
Event | Recent Trends in Optical Systems Design and Computer Lens Design Workshop 1987 - Los Angeles, United States Duration: Jan 12 1987 → Jan 16 1987 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Computer Science Applications
- Applied Mathematics
- Electrical and Electronic Engineering