Polarization imaging light scattering facility

Hannah Noble, Greg A. Smith, Sze Lam Wai, Steve McClain, Russell A. Chipman

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations


Understanding the interaction of polarized light with materials is critical to applications such as remote sensing, laser radar, and quality control. The availability of angular and spatial information add additional dimensions to this understanding. A facility is constructed for Mueller Matrix Bidirectional Reflectance Distribution (MMBRDF) imaging. Polarized light at near infrared and visible wavelengths is scattered from samples ranging from bare metals to complex organic structures with various textures and orientations. The resulting scattered polarized light is measured with a Mueller matrix active imaging Polarimeter. The in-plane MMBRDF is measured for a sanded aluminum sample as a demonstration of the facility. The aluminum is found to be a weak depolarizer, with a somewhat higher depolarization index at specular angles. Retardance is dominated by its linear component and is close to 180° for the majority of angles. Diattenuation is weak, especially in the specular region, and increases in the region further away from specular angles.

Original languageEnglish (US)
Title of host publicationPolarization Science and Remote Sensing III
StatePublished - 2007
EventPolarization Science and Remote Sensing III - San Diego, CA, United States
Duration: Aug 29 2007Aug 30 2007

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
ISSN (Print)0277-786X


OtherPolarization Science and Remote Sensing III
Country/TerritoryUnited States
CitySan Diego, CA

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering


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