Abstract
This paper presents a novel measurement technique using a Mueller matrix imaging polarimeter to measure the near-angle polarization BRDF of reflective samples. A measurement is made on a diamond turned aluminum mirror with an rms roughness of 11.4nm, and the results are interpreted.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 160-167 |
| Number of pages | 8 |
| Journal | Proceedings of SPIE - The International Society for Optical Engineering |
| Volume | 2260 |
| DOIs | |
| State | Published - Oct 7 1994 |
| Externally published | Yes |
| Event | Stray Radiation in Optical Systems III 1994 - San Diego, United States Duration: Jul 24 1994 → Jul 29 1994 |
Keywords
- BRDF
- Mueller matrices
- Polarimetry
- Scattering
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Computer Science Applications
- Applied Mathematics
- Electrical and Electronic Engineering