Polarization BRDF

J. Larry Pezzaniti, Russell A. Chipman, Stephen C. McClain

Research output: Contribution to journalConference articlepeer-review

1 Scopus citations


This paper presents a novel measurement technique using a Mueller matrix imaging polarimeter to measure the near-angle polarization BRDF of reflective samples. A measurement is made on a diamond turned aluminum mirror with an rms roughness of 11.4nm, and the results are interpreted.

Original languageEnglish (US)
Pages (from-to)160-167
Number of pages8
JournalProceedings of SPIE - The International Society for Optical Engineering
StatePublished - Oct 7 1994
EventStray Radiation in Optical Systems III 1994 - San Diego, United States
Duration: Jul 24 1994Jul 29 1994


  • BRDF
  • Mueller matrices
  • Polarimetry
  • Scattering

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering


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