Polarization BRDF

J. Larry Pezzaniti; Russell A. Chipman; Stephen C. McClain

doi:10.1117/12.189211

Polarization BRDF

J. Larry Pezzaniti, Russell A. Chipman, Stephen C. McClain

Research output: Contribution to journal › Conference article › peer-review

1 Scopus citations

Abstract

This paper presents a novel measurement technique using a Mueller matrix imaging polarimeter to measure the near-angle polarization BRDF of reflective samples. A measurement is made on a diamond turned aluminum mirror with an rms roughness of 11.4nm, and the results are interpreted.

Original language	English (US)
Pages (from-to)	160-167
Number of pages	8
Journal	Proceedings of SPIE - The International Society for Optical Engineering
Volume	2260
DOIs	https://doi.org/10.1117/12.189211
State	Published - Oct 7 1994
Externally published	Yes
Event	Stray Radiation in Optical Systems III 1994 - San Diego, United States Duration: Jul 24 1994 → Jul 29 1994

Keywords

BRDF
Mueller matrices
Polarimetry
Scattering

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Computer Science Applications
Applied Mathematics
Electrical and Electronic Engineering

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10.1117/12.189211

Cite this

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title = "Polarization BRDF",

abstract = "This paper presents a novel measurement technique using a Mueller matrix imaging polarimeter to measure the near-angle polarization BRDF of reflective samples. A measurement is made on a diamond turned aluminum mirror with an rms roughness of 11.4nm, and the results are interpreted.",

keywords = "BRDF, Mueller matrices, Polarimetry, Scattering",

author = "{Larry Pezzaniti}, J. and Chipman, {Russell A.} and McClain, {Stephen C.}",

year = "1994",

month = oct,

day = "7",

doi = "10.1117/12.189211",

language = "English (US)",

volume = "2260",

pages = "160--167",

journal = "Proceedings of SPIE - The International Society for Optical Engineering",

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TY - JOUR

T1 - Polarization BRDF

AU - Larry Pezzaniti, J.

AU - Chipman, Russell A.

AU - McClain, Stephen C.

PY - 1994/10/7

Y1 - 1994/10/7

N2 - This paper presents a novel measurement technique using a Mueller matrix imaging polarimeter to measure the near-angle polarization BRDF of reflective samples. A measurement is made on a diamond turned aluminum mirror with an rms roughness of 11.4nm, and the results are interpreted.

AB - This paper presents a novel measurement technique using a Mueller matrix imaging polarimeter to measure the near-angle polarization BRDF of reflective samples. A measurement is made on a diamond turned aluminum mirror with an rms roughness of 11.4nm, and the results are interpreted.

KW - BRDF

KW - Mueller matrices

KW - Polarimetry

KW - Scattering

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UR - http://www.scopus.com/inward/citedby.url?scp=85076472091&partnerID=8YFLogxK

U2 - 10.1117/12.189211

DO - 10.1117/12.189211

M3 - Conference article

AN - SCOPUS:85076472091

SN - 0277-786X

VL - 2260

SP - 160

EP - 167

JO - Proceedings of SPIE - The International Society for Optical Engineering

JF - Proceedings of SPIE - The International Society for Optical Engineering

T2 - Stray Radiation in Optical Systems III 1994

Y2 - 24 July 1994 through 29 July 1994

ER -

Polarization BRDF

Abstract

Keywords

ASJC Scopus subject areas

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