TY - GEN
T1 - Planning for inspection based on cad models
AU - Marefat, M.
AU - Kashyap, R. L.
N1 - Publisher Copyright:
© 1992 IEEE.
PY - 1992
Y1 - 1992
N2 - In this paper, we briefly describe a knowledge-based inspection planning system for solid objects. The goals of intelligent inspection planning include determining (i) which entities (edges, etc) of the object should be measured, (ii) what camera locations and viewing directions should be used to perform inspection, and (iii) how can the search for these entities, and their inspection be robustly and efficiently done once the sensor data is obtained. An effective solution to this problem is clearly very important not only from the automation point of view, but also in order to effectively gather and use sensor information to overcome the volume and complexity of required information for adequate performance.
AB - In this paper, we briefly describe a knowledge-based inspection planning system for solid objects. The goals of intelligent inspection planning include determining (i) which entities (edges, etc) of the object should be measured, (ii) what camera locations and viewing directions should be used to perform inspection, and (iii) how can the search for these entities, and their inspection be robustly and efficiently done once the sensor data is obtained. An effective solution to this problem is clearly very important not only from the automation point of view, but also in order to effectively gather and use sensor information to overcome the volume and complexity of required information for adequate performance.
UR - http://www.scopus.com/inward/record.url?scp=2342503361&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=2342503361&partnerID=8YFLogxK
U2 - 10.1109/ICPR.1992.201635
DO - 10.1109/ICPR.1992.201635
M3 - Conference contribution
AN - SCOPUS:2342503361
SN - 081862910X
T3 - Proceedings - International Conference on Pattern Recognition
SP - 608
EP - 611
BT - Conference A
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 11th IAPR International Conference on Pattern Recognition, IAPR 1992
Y2 - 30 August 1992 through 3 September 1992
ER -