Abstract
ZnO films exhibit a wide range of interesting material properties. Recently, ZnO films have been studied for sensing applications based . on their piezoelectric and pyroelectric behaviors. Reported literature values of piezoelectric and pyroelectric coefficients of ZnO films are in the range of 11-12 pm/V and 1.0-1.4 nC/cm2-K respectively. In this study, the piezoelectric properties of sol-gel derived ZnO thin films were measured. These films were prepared on platinized Si wafers and fired to temperatures ranging from 550°C to 750°C. Multiple spincoating was performed with an intermediate/king at 400°C between coatings to obtain films up to 6000 A thick. Top Pt electrodes were sputtered to form monolithic capacitors. XRD indicated that the films consisted of crystalline wurtzite at firing temperatures as low as 400°C, and that the c-axis orientation increased with increasing firing temperature. A dielectric constant of 10 was obtained, while piezoelectric characterization indicated d33 values as large as 12 pm/V i.e., values similar to those of bulk ZnO.
Original language | English (US) |
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Pages (from-to) | 339-347 |
Number of pages | 9 |
Journal | Integrated Ferroelectrics |
Volume | 17 |
Issue number | 1-4 |
DOIs | |
State | Published - 1997 |
Keywords
- Films
- Piezoelectric
- Sol-gel
- ZnO
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Control and Systems Engineering
- Ceramics and Composites
- Condensed Matter Physics
- Electrical and Electronic Engineering
- Materials Chemistry