Piezoelectric characterization of bulk and thin film ferroelectric materials using fiber optics

J. T. Dawley; G. Teowee; B. J.J. Zelinski; D. R. Uhlmann

doi:10.1557/proc-433-317

Piezoelectric characterization of bulk and thin film ferroelectric materials using fiber optics

J. T. Dawley, G. Teowee, B. J.J. Zelinski, D. R. Uhlmann

Research output: Contribution to journal › Conference article › peer-review

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Abstract

In this study, the use of a fiber optic technique for the measurement of the piezoelectric properties of ferroelectric bulk and thin film samples was investigated. The strain and piezoelectric properties (namely the d₃₃ coefficients) were measured using the MTI-2000 Fotonic Sensor, which uses the principle of the optical lever to resolve very small changes in sample displacement (1 angstrom). Using this technique, we were able to detect the very small strains associated with the converse piezoelectric effect for PVDF films and bulk PZT samples, and correlate the results with data acquired from direct piezoelectric effect measurement. Comparison of the data sets prove that the optical lever would be a useful optical technique for measuring of the d₃₃ values of ceramic thin films, such as BaTiO₃, ZnO, and PZT.

Original language	English (US)
Pages (from-to)	317-323
Number of pages	7
Journal	Materials Research Society Symposium - Proceedings
Volume	433
DOIs	https://doi.org/10.1557/proc-433-317
State	Published - 1996
Event	Proceedings of the 1996 MRS Spring Symposium - San Francisco, CA, USA Duration: Apr 8 1996 → Apr 12 1996

ASJC Scopus subject areas

Materials Science(all)
Condensed Matter Physics
Mechanics of Materials
Mechanical Engineering

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title = "Piezoelectric characterization of bulk and thin film ferroelectric materials using fiber optics",

abstract = "In this study, the use of a fiber optic technique for the measurement of the piezoelectric properties of ferroelectric bulk and thin film samples was investigated. The strain and piezoelectric properties (namely the d33 coefficients) were measured using the MTI-2000 Fotonic Sensor, which uses the principle of the optical lever to resolve very small changes in sample displacement (1 angstrom). Using this technique, we were able to detect the very small strains associated with the converse piezoelectric effect for PVDF films and bulk PZT samples, and correlate the results with data acquired from direct piezoelectric effect measurement. Comparison of the data sets prove that the optical lever would be a useful optical technique for measuring of the d33 values of ceramic thin films, such as BaTiO3, ZnO, and PZT.",

author = "Dawley, {J. T.} and G. Teowee and Zelinski, {B. J.J.} and Uhlmann, {D. R.}",

year = "1996",

doi = "10.1557/proc-433-317",

language = "English (US)",

volume = "433",

pages = "317--323",

journal = "Materials Research Society Symposium - Proceedings",

issn = "0272-9172",

publisher = "Materials Research Society",

note = "Proceedings of the 1996 MRS Spring Symposium ; Conference date: 08-04-1996 Through 12-04-1996",

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TY - JOUR

T1 - Piezoelectric characterization of bulk and thin film ferroelectric materials using fiber optics

AU - Dawley, J. T.

AU - Teowee, G.

AU - Zelinski, B. J.J.

AU - Uhlmann, D. R.

PY - 1996

Y1 - 1996

N2 - In this study, the use of a fiber optic technique for the measurement of the piezoelectric properties of ferroelectric bulk and thin film samples was investigated. The strain and piezoelectric properties (namely the d33 coefficients) were measured using the MTI-2000 Fotonic Sensor, which uses the principle of the optical lever to resolve very small changes in sample displacement (1 angstrom). Using this technique, we were able to detect the very small strains associated with the converse piezoelectric effect for PVDF films and bulk PZT samples, and correlate the results with data acquired from direct piezoelectric effect measurement. Comparison of the data sets prove that the optical lever would be a useful optical technique for measuring of the d33 values of ceramic thin films, such as BaTiO3, ZnO, and PZT.

AB - In this study, the use of a fiber optic technique for the measurement of the piezoelectric properties of ferroelectric bulk and thin film samples was investigated. The strain and piezoelectric properties (namely the d33 coefficients) were measured using the MTI-2000 Fotonic Sensor, which uses the principle of the optical lever to resolve very small changes in sample displacement (1 angstrom). Using this technique, we were able to detect the very small strains associated with the converse piezoelectric effect for PVDF films and bulk PZT samples, and correlate the results with data acquired from direct piezoelectric effect measurement. Comparison of the data sets prove that the optical lever would be a useful optical technique for measuring of the d33 values of ceramic thin films, such as BaTiO3, ZnO, and PZT.

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DO - 10.1557/proc-433-317

M3 - Conference article

AN - SCOPUS:0030402827

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EP - 323

JO - Materials Research Society Symposium - Proceedings

JF - Materials Research Society Symposium - Proceedings

T2 - Proceedings of the 1996 MRS Spring Symposium

Y2 - 8 April 1996 through 12 April 1996

ER -

Piezoelectric characterization of bulk and thin film ferroelectric materials using fiber optics

Abstract

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