@inproceedings{536cfd76310449148b274cd321d74068,
title = "Photonic chip for visible interferometry: laboratory characterization and comparison with the theoretical model",
abstract = "Integrated optics are used to achieve astronomical interferometry inside robust and compact materials, improving the instruments stability and sensitivity. In order to perform differential phase measurements at the Hα line (656.3nm) with the 600-800nm spectro-interferometer FIRST, a photonic integrated circuit (PIC) is being developed. This PIC performs the visible combination of the beams coming from the telescope pupil sub-apertures. In this work, TEEM Photonics waveguides fabricated by K+: Na+ ion exchange in glass are characterized in terms of single-mode range and mode field diameter. The waveguide diffused index profile is modeled on Beamprop software. FIRST beam combiner building blocks are simulated, especially achromatic directional couplers and passive 2 phase shifters for a potential ABCD interferometric combination.",
keywords = "Interferometry, beam combiners, high angular resolution, high contrast, pupil remapping, spectroscopy, visible photonics",
author = "Manon Lallement and Sylvestre Lacour and Elsa Huby and Guillermo Martin and Kevin Barjot and Guy Perrin and Daniel Rouan and Vincent Lapeyrere and S{\'e}bastien Vievard and Olivier Guyon and Julien Lozi and Vincent Deo and Takayuki Kotani and Cecil Pham and Cedric Cassagnettes and Adrien Billat and Nick Cvetojevic and Franck Marchis",
note = "Publisher Copyright: {\textcopyright} COPYRIGHT SPIE. Downloading of the abstract is permitted for personal use only.; Advances in Optical and Mechanical Technologies for Telescopes and Instrumentation V 2022 ; Conference date: 17-07-2022 Through 22-07-2022",
year = "2022",
doi = "10.1117/12.2629449",
language = "English (US)",
series = "Proceedings of SPIE - The International Society for Optical Engineering",
publisher = "SPIE",
editor = "Ramon Navarro and Roland Geyl",
booktitle = "Advances in Optical and Mechanical Technologies for Telescopes and Instrumentation V",
}