Phasor analysis of atom diffraction from a rotated material grating

Alexander D. Cronin; John D. Perreault

doi:10.1103/PhysRevA.70.043607

Phasor analysis of atom diffraction from a rotated material grating

Alexander D. Cronin, John D. Perreault

Physics

Research output: Contribution to journal › Article › peer-review

25 Scopus citations

Abstract

The use of atom diffraction from a rotated material grating to detect an atom-surface interaction was discussed. A phasor diagram was developed to explain why there are no missing orders in atom diffraction form material gratings. It was demonstrated that atom-surface interactions combined with rotated grating structures can produce asymmetric diffraction patterns. It was suggested that by twisting a 100-nm period diffraction grating, atom-surface interactions can prevent missing orders and cause asymmetric diffraction patterns.

Original language	English (US)
Article number	043607
Pages (from-to)	043607-1-043607-5
Journal	Physical Review A - Atomic, Molecular, and Optical Physics
Volume	70
Issue number	4
DOIs	https://doi.org/10.1103/PhysRevA.70.043607
State	Published - Oct 2004

ASJC Scopus subject areas

Atomic and Molecular Physics, and Optics

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10.1103/PhysRevA.70.043607

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abstract = "The use of atom diffraction from a rotated material grating to detect an atom-surface interaction was discussed. A phasor diagram was developed to explain why there are no missing orders in atom diffraction form material gratings. It was demonstrated that atom-surface interactions combined with rotated grating structures can produce asymmetric diffraction patterns. It was suggested that by twisting a 100-nm period diffraction grating, atom-surface interactions can prevent missing orders and cause asymmetric diffraction patterns.",

author = "Cronin, {Alexander D.} and Perreault, {John D.}",

note = "Funding Information: This work was supported by the Research Corporation. We thank T. Savas and H.I. Smith for fabricating the 100 nanometer period material gratings . We also thank B. Anderson for a critical reading of this manuscript and both H. Uys and P. Hoerner for technical assistance.",

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Phasor analysis of atom diffraction from a rotated material grating

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