Abstract
Within the finite element framework, a commonly accepted indirect approach employs the concept of normalized concentration to compute moisture concentration. It is referred to as “wetness” approach. If the saturated concentration value is not dependent on temperature or time, the wetness equation is analogous to the standard diffusion equation whose solution can be constructed by using any commercial finite element analysis software such as ANSYS. However, the time dependency of saturated concentration requires special treatment under temperature dependent environmental conditions such as reflow process. As a result, the wetness equation is not directly analogous to the standard diffusion equation. This study presents the peridynamic wetness modeling for time dependent saturated concentration for computation of moisture concentration in electronic packages. It is computationally efficient as well as easy to implement without any iterations in each time step. Numerical results concerning the one-dimensional analysis illustrate the accuracy of this approach. Moisture concentration calculation in a three-dimensional electronic package configuration with many different material layers demonstrates its robustness.
Original language | English (US) |
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Pages (from-to) | 103-111 |
Number of pages | 9 |
Journal | Microelectronics Reliability |
Volume | 70 |
DOIs | |
State | Published - Mar 1 2017 |
Keywords
- Concentration
- Moisture
- Peridynamics
- Wetness
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Safety, Risk, Reliability and Quality
- Surfaces, Coatings and Films
- Atomic and Molecular Physics, and Optics
- Electrical and Electronic Engineering