Performance, manufacturability, and qualification advances of high-power VCSEL arrays at TriLumina Corporation

Thomas R. Fanning; John Maynard; Christopher J. Helms; Lei Yang; David Podva; Jeff Earls; Jacob Lopez; Michael Chung; James Foresi; Mial E. Warren; Gianluca Bacchin

doi:10.1117/12.2546689

Performance, manufacturability, and qualification advances of high-power VCSEL arrays at TriLumina Corporation

Thomas R. Fanning
, John Maynard
, Christopher J. Helms
, Lei Yang
, David Podva
, Jeff Earls
, Jacob Lopez
, Michael Chung
, James Foresi
, Mial E. Warren
, Gianluca Bacchin

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

5 Scopus citations

Abstract

TriLumina develops and manufactures flip-chip VCSEL technology used in 3D sensing applications that must meet automotive grade 1 temperature range (-40°C to 125°C) performance and be tested to high reliability standards and criteria (AEC-Q102). Advances in VCSEL efficiency, performance and automotive qualification of TriLumina's selfhermetic flip-chip VCSEL are discußed. TriLumina's VCSEL-on-board (VoB), surface-mount technology VCSEL is introduced.

Original language	English (US)
Title of host publication	Vertical-Cavity Surface-Emitting Lasers XXIV
Editors	Luke A. Graham, Chun Lei
Publisher	SPIE
ISBN (Electronic)	9781510633636
DOIs	https://doi.org/10.1117/12.2546689
State	Published - 2020
Externally published	Yes
Event	Vertical-Cavity Surface-Emitting Lasers XXIV 2020 - San Francisco, United States Duration: Feb 5 2020 → Feb 6 2020

Publication series

Name	Proceedings of SPIE - The International Society for Optical Engineering
Volume	11300
ISSN (Print)	0277-786X
ISSN (Electronic)	1996-756X

Conference

Conference	Vertical-Cavity Surface-Emitting Lasers XXIV 2020
Country/Territory	United States
City	San Francisco
Period	2/5/20 → 2/6/20

Keywords

AEC-Q102
Laser array
LiDAR
VCSEL
VCSEL array
VCSEL reliability

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Computer Science Applications
Applied Mathematics
Electrical and Electronic Engineering

Access to Document

10.1117/12.2546689

Cite this

Fanning, T. R., Maynard, J., Helms, C. J., Yang, L., Podva, D., Earls, J., Lopez, J., Chung, M., Foresi, J., Warren, M. E., & Bacchin, G. (2020). Performance, manufacturability, and qualification advances of high-power VCSEL arrays at TriLumina Corporation. In L. A. Graham, & C. Lei (Eds.), Vertical-Cavity Surface-Emitting Lasers XXIV Article 1130002 (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 11300). SPIE. https://doi.org/10.1117/12.2546689

Performance, manufacturability, and qualification advances of high-power VCSEL arrays at TriLumina Corporation. / Fanning, Thomas R.; Maynard, John; Helms, Christopher J. et al.
Vertical-Cavity Surface-Emitting Lasers XXIV. ed. / Luke A. Graham; Chun Lei. SPIE, 2020. 1130002 (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 11300).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Fanning, TR, Maynard, J, Helms, CJ, Yang, L, Podva, D, Earls, J, Lopez, J, Chung, M, Foresi, J, Warren, ME & Bacchin, G 2020, Performance, manufacturability, and qualification advances of high-power VCSEL arrays at TriLumina Corporation. in LA Graham & C Lei (eds), Vertical-Cavity Surface-Emitting Lasers XXIV., 1130002, Proceedings of SPIE - The International Society for Optical Engineering, vol. 11300, SPIE, Vertical-Cavity Surface-Emitting Lasers XXIV 2020, San Francisco, United States, 2/5/20. https://doi.org/10.1117/12.2546689

Fanning TR, Maynard J, Helms CJ, Yang L, Podva D, Earls J et al. Performance, manufacturability, and qualification advances of high-power VCSEL arrays at TriLumina Corporation. In Graham LA, Lei C, editors, Vertical-Cavity Surface-Emitting Lasers XXIV. SPIE. 2020. 1130002. (Proceedings of SPIE - The International Society for Optical Engineering). doi: 10.1117/12.2546689

@inproceedings{bb165394786e4439910c548356c60d25,

title = "Performance, manufacturability, and qualification advances of high-power VCSEL arrays at TriLumina Corporation",

abstract = "TriLumina develops and manufactures flip-chip VCSEL technology used in 3D sensing applications that must meet automotive grade 1 temperature range (-40°C to 125°C) performance and be tested to high reliability standards and criteria (AEC-Q102). Advances in VCSEL efficiency, performance and automotive qualification of TriLumina's selfhermetic flip-chip VCSEL are discu{\ss}ed. TriLumina's VCSEL-on-board (VoB), surface-mount technology VCSEL is introduced.",

keywords = "AEC-Q102, Laser array, LiDAR, VCSEL, VCSEL array, VCSEL reliability",

author = "Fanning, \{Thomas R.\} and John Maynard and Helms, \{Christopher J.\} and Lei Yang and David Podva and Jeff Earls and Jacob Lopez and Michael Chung and James Foresi and Warren, \{Mial E.\} and Gianluca Bacchin",

note = "Publisher Copyright: {\textcopyright} COPYRIGHT SPIE. Downloading of the abstract is permitted for personal use only.; Vertical-Cavity Surface-Emitting Lasers XXIV 2020 ; Conference date: 05-02-2020 Through 06-02-2020",

year = "2020",

doi = "10.1117/12.2546689",

language = "English (US)",

series = "Proceedings of SPIE - The International Society for Optical Engineering",

publisher = "SPIE",

editor = "Graham, \{Luke A.\} and Chun Lei",

booktitle = "Vertical-Cavity Surface-Emitting Lasers XXIV",

}

TY - GEN

T1 - Performance, manufacturability, and qualification advances of high-power VCSEL arrays at TriLumina Corporation

AU - Fanning, Thomas R.

AU - Maynard, John

AU - Helms, Christopher J.

AU - Yang, Lei

AU - Podva, David

AU - Earls, Jeff

AU - Lopez, Jacob

AU - Chung, Michael

AU - Foresi, James

AU - Warren, Mial E.

AU - Bacchin, Gianluca

N1 - Publisher Copyright: © COPYRIGHT SPIE. Downloading of the abstract is permitted for personal use only.

PY - 2020

Y1 - 2020

N2 - TriLumina develops and manufactures flip-chip VCSEL technology used in 3D sensing applications that must meet automotive grade 1 temperature range (-40°C to 125°C) performance and be tested to high reliability standards and criteria (AEC-Q102). Advances in VCSEL efficiency, performance and automotive qualification of TriLumina's selfhermetic flip-chip VCSEL are discußed. TriLumina's VCSEL-on-board (VoB), surface-mount technology VCSEL is introduced.

AB - TriLumina develops and manufactures flip-chip VCSEL technology used in 3D sensing applications that must meet automotive grade 1 temperature range (-40°C to 125°C) performance and be tested to high reliability standards and criteria (AEC-Q102). Advances in VCSEL efficiency, performance and automotive qualification of TriLumina's selfhermetic flip-chip VCSEL are discußed. TriLumina's VCSEL-on-board (VoB), surface-mount technology VCSEL is introduced.

KW - AEC-Q102

KW - Laser array

KW - LiDAR

KW - VCSEL

KW - VCSEL array

KW - VCSEL reliability

UR - https://www.scopus.com/pages/publications/85082778911

UR - https://www.scopus.com/pages/publications/85082778911#tab=citedBy

U2 - 10.1117/12.2546689

DO - 10.1117/12.2546689

M3 - Conference contribution

AN - SCOPUS:85082778911

T3 - Proceedings of SPIE - The International Society for Optical Engineering

BT - Vertical-Cavity Surface-Emitting Lasers XXIV

A2 - Graham, Luke A.

A2 - Lei, Chun

PB - SPIE

T2 - Vertical-Cavity Surface-Emitting Lasers XXIV 2020

Y2 - 5 February 2020 through 6 February 2020

ER -

Performance, manufacturability, and qualification advances of high-power VCSEL arrays at TriLumina Corporation

Abstract

Publication series

Conference

Keywords

ASJC Scopus subject areas

Access to Document

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