TY - GEN
T1 - Performance evaluation of faulty iterative decoders using absorbing Markov chains
AU - Ivanis, Predrag
AU - Vasic, Bane
AU - Declercq, David
N1 - Publisher Copyright:
© 2016 IEEE.
PY - 2016/8/10
Y1 - 2016/8/10
N2 - We propose an iterative decoder made of a combination of faulty and perfect logic gates that is capable of correcting more channel errors than its counterpart made completely of perfect logic gates. We present an error probability analysis based on absorbing Markov chains, and explain how the randomness in the check node update function helps a decoder to escape to local minima associated with trapping sets. For the (155, 64) Tanner low-density parity check code, we provide a range of gate failure probabilities for which imperfect decoders perform better.
AB - We propose an iterative decoder made of a combination of faulty and perfect logic gates that is capable of correcting more channel errors than its counterpart made completely of perfect logic gates. We present an error probability analysis based on absorbing Markov chains, and explain how the randomness in the check node update function helps a decoder to escape to local minima associated with trapping sets. For the (155, 64) Tanner low-density parity check code, we provide a range of gate failure probabilities for which imperfect decoders perform better.
UR - https://www.scopus.com/pages/publications/84985919804
UR - https://www.scopus.com/pages/publications/84985919804#tab=citedBy
U2 - 10.1109/ISIT.2016.7541562
DO - 10.1109/ISIT.2016.7541562
M3 - Conference contribution
AN - SCOPUS:84985919804
T3 - IEEE International Symposium on Information Theory - Proceedings
SP - 1566
EP - 1570
BT - Proceedings - ISIT 2016; 2016 IEEE International Symposium on Information Theory
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2016 IEEE International Symposium on Information Theory, ISIT 2016
Y2 - 10 July 2016 through 15 July 2016
ER -