Abstract
Perpendicular magnetic tunnel junctions (p-MTJs) were patterned into nanopillars using electron-beam lithography to study their scaling and switching behaviour. Magnetoresistance measurements of annealed and unannealed p-MTJ films using scanning probe microscopy showed good agreement with Monte Carlo modeling. p-MTJ pillars demonstrated clear parallel magnetic states, both 'up' or both 'down' following AC-demagnetization. Significant variability in the resistance of p-MTJ pillars was observed and attributed to edge features generated during patterning or local inhomogeneity in the MgO layer.
Original language | English (US) |
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Article number | 185302 |
Journal | Nanotechnology |
Volume | 27 |
Issue number | 18 |
DOIs | |
State | Published - Mar 23 2016 |
Keywords
- magnetoresistance
- metal nanopillars
- nanofabrication
- perpendicular magnetic tunnel junctions
- spintronics
ASJC Scopus subject areas
- Bioengineering
- General Chemistry
- General Materials Science
- Mechanics of Materials
- Mechanical Engineering
- Electrical and Electronic Engineering