TY - GEN
T1 - Pad surfacemicrostructure and optimization of the conditioning sweep
AU - Borucki, L.
AU - Wei, X.
AU - Zhuang, Y.
AU - Philipossian, A.
AU - Slutz, D.
N1 - Publisher Copyright:
© ICPT 2007 - International Conference on Planarization/CMP Technology, Proceedings. All rights reserved.
PY - 2007
Y1 - 2007
N2 - This paper investigates the question of whether optimization of the conditioning sweep schedule on a commercial rotary polishing tool to produce and maintain the flattest possible macroscopic pad surface can produce, as a side effect, significant changes in pad microscopic surface topography. We first condition a pad to steady state using a sinusoidal sweep and a well-characterized conditioner and measure both the macroscopic pad thickness profile and the microscopic topography at several radii. Tool operational parameters and conditioner data are then used in a pad conditioning model to successfully match the measured macroscopic pad thickness profile. We find in matching the profile that the subpad elastic modulus significantly affects the predicted pad thickness variation. After using the model to optimize the conditioning sweep, we then repeat the steady state conditioning experiment to verify that the pad meets flatness expectations and measure changes in the microscopic surface texture.
AB - This paper investigates the question of whether optimization of the conditioning sweep schedule on a commercial rotary polishing tool to produce and maintain the flattest possible macroscopic pad surface can produce, as a side effect, significant changes in pad microscopic surface topography. We first condition a pad to steady state using a sinusoidal sweep and a well-characterized conditioner and measure both the macroscopic pad thickness profile and the microscopic topography at several radii. Tool operational parameters and conditioner data are then used in a pad conditioning model to successfully match the measured macroscopic pad thickness profile. We find in matching the profile that the subpad elastic modulus significantly affects the predicted pad thickness variation. After using the model to optimize the conditioning sweep, we then repeat the steady state conditioning experiment to verify that the pad meets flatness expectations and measure changes in the microscopic surface texture.
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M3 - Conference contribution
AN - SCOPUS:78650316270
T3 - ICPT 2007 - International Conference on Planarization/CMP Technology, Proceedings
SP - 367
EP - 371
BT - ICPT 2007 - International Conference on Planarization/CMP Technology, Proceedings
PB - VDE Verlag GmbH
T2 - 2007 International Conference on Planarization/CMP Technology, ICPT 2007
Y2 - 25 October 2007 through 27 October 2007
ER -