Optimizing de lectometry to suppress ghost signal noise

Byeongjoon Jeong, Heejoo Choi, Sotero Ordones, Daewook Kim

Research output: Chapter in Book/Report/Conference proceedingConference contribution


We introduce a modifying deflectometry m ethod t o r educe p arasitic g host s ignal n oises i n t ransparent optical testing. The proposed approach shows adjusting the screen distance and displayed screen pattern to shrink the light from undesired surfaces’ reflection. The flexibility of deflectometry optical layout allows huge adjustment availability while keeping the optical testing capability and suppressing the parasite signal. Moreover, the customized fringe pattern could shine the desired surface only effectively. Ray tracing simulation shows the best system formation, and the modified experimental setup confirms the proposed method for various types of optics testing. Lastly, we discuss the limitations of the method.

Original languageEnglish (US)
Title of host publicationAstronomical Optics
Subtitle of host publicationDesign, Manufacture, and Test of Space and Ground Systems IV
EditorsTony B. Hull, Daewook Kim, Pascal Hallibert
ISBN (Electronic)9781510665682
StatePublished - 2023
EventAstronomical Optics: Design, Manufacture, and Test of Space and Ground Systems IV 2023 - San Diego, United States
Duration: Aug 21 2023Aug 24 2023

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X


ConferenceAstronomical Optics: Design, Manufacture, and Test of Space and Ground Systems IV 2023
Country/TerritoryUnited States
CitySan Diego


  • Optical Testing
  • Phase Measuring Deflectometry
  • ghost signal noise noise

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering


Dive into the research topics of 'Optimizing de lectometry to suppress ghost signal noise'. Together they form a unique fingerprint.

Cite this