Optimizing a multiple-pinhole spect system using the ideal observer

Kevin Gross, Matthew A. Kupinski, Todd Peterson, Eric Clarkson

Research output: Contribution to journalConference articlepeer-review

16 Scopus citations


In a pinhole imaging system, multiple pinholes are potentially beneficial since more radiation will arrive in the detector plane. However, the various images produced by each pinhole may multiplex (overlap), possibly decreasing image quality. In this work we develop the framework for comparing various pinhole configurations using ideal-observer performance as a figure of merit. We compute the ideal-observer test statistic, the likelihood ratio, using a statistical method known as Markov-Chain Monte Carlo. For different imaging systems, we estimate the likelihood ratio for many realizations of noisy image data both with and without a signal present. For each imaging system, the area under the ROC curve provides a meaningful figure of merit for hardware comparison. In this work we compare different pinhole configurations using a three-dimensional lumpy object model, a known signal (SKE), and simulated pinhole imaging systems. The results of our work will eventually serve as a basis for a design of high-resolution pinhole SPECT systems.

Original languageEnglish (US)
Pages (from-to)314-322
Number of pages9
JournalProceedings of SPIE - The International Society for Optical Engineering
StatePublished - 2003
EventMedical Imaging 2003: Image Perception, Observer Performance, and Technology Assessment - San Diego, CA, United States
Duration: Feb 18 2003Feb 20 2003


  • Hardware optimization
  • Ideal observer
  • Image quality
  • Markov-Chain Monte Carlo
  • Object statistics
  • Parallel processing
  • Signal detection
  • Task based

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering


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