Optimization of the temporal response of II-IV direct type semiconductor detectors for flat-panel pulsed X-ray imaging

  • George C. Giakos
  • , R. Guntupalli
  • , R. Nemer
  • , J. Odogba
  • , N. Shah
  • , S. Vedantham
  • , S. Suryanarayanan
  • , S. Chowdhury
  • , A. G. Passerini
  • , K. Mehta
  • , S. Sumrain
  • , N. Patnekar
  • , K. Nataraj
  • , E. Evans
  • , F. Russo

Research output: Contribution to journalArticlepeer-review

1 Scopus citations

Abstract

The rising and falling edges of detected signal pulses have been measured utilizing x-ray ionization of a planar Cd 1-xZn xTe system under different irradiation geometries, at different detector thicknesses, and applied electric fields. The experimental results of this study indicate that the time response of the CdZnTe based x-ray system is suitable for digital pulsed radiographic applications.

Original languageEnglish (US)
Pages (from-to)1610-1614
Number of pages5
JournalIEEE Transactions on Instrumentation and Measurement
Volume50
Issue number6
DOIs
StatePublished - Dec 2001
Externally publishedYes

Keywords

  • CdZnTe detector
  • Flat-panel digital radiography
  • Pulsed x-ray imaging
  • Temporal response

ASJC Scopus subject areas

  • Instrumentation
  • Electrical and Electronic Engineering

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