Optimization of the temporal response of II-IV direct type semiconductor detectors for flat-panel pulsed X-ray imaging

George C. Giakos; R. Guntupalli; R. Nemer; J. Odogba; N. Shah; S. Vedantham; S. Suryanarayanan; S. Chowdhury; A. G. Passerini; K. Mehta; S. Sumrain; N. Patnekar; K. Nataraj; E. Evans; F. Russo

doi:10.1109/19.982954

Optimization of the temporal response of II-IV direct type semiconductor detectors for flat-panel pulsed X-ray imaging

George C. Giakos, R. Guntupalli, R. Nemer, J. Odogba, N. Shah, S. Vedantham, S. Suryanarayanan, S. Chowdhury, A. G. Passerini, K. Mehta, S. Sumrain, N. Patnekar, K. Nataraj, E. Evans, F. Russo

Research output: Contribution to journal › Article › peer-review

Abstract

The rising and falling edges of detected signal pulses have been measured utilizing x-ray ionization of a planar Cd _1-xZn _xTe system under different irradiation geometries, at different detector thicknesses, and applied electric fields. The experimental results of this study indicate that the time response of the CdZnTe based x-ray system is suitable for digital pulsed radiographic applications.

Original language	English (US)
Pages (from-to)	1610-1614
Number of pages	5
Journal	IEEE Transactions on Instrumentation and Measurement
Volume	50
Issue number	6
DOIs	https://doi.org/10.1109/19.982954
State	Published - Dec 2001
Externally published	Yes

Keywords

CdZnTe detector
Flat-panel digital radiography
Pulsed x-ray imaging
Temporal response

ASJC Scopus subject areas

Instrumentation
Electrical and Electronic Engineering

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Giakos, G. C., Guntupalli, R., Nemer, R., Odogba, J., Shah, N., Vedantham, S., Suryanarayanan, S., Chowdhury, S., Passerini, A. G., Mehta, K., Sumrain, S., Patnekar, N., Nataraj, K., Evans, E., & Russo, F. (2001). Optimization of the temporal response of II-IV direct type semiconductor detectors for flat-panel pulsed X-ray imaging. IEEE Transactions on Instrumentation and Measurement, 50(6), 1610-1614. https://doi.org/10.1109/19.982954

Giakos, GC, Guntupalli, R, Nemer, R, Odogba, J, Shah, N, Vedantham, S, Suryanarayanan, S, Chowdhury, S, Passerini, AG, Mehta, K, Sumrain, S, Patnekar, N, Nataraj, K, Evans, E & Russo, F 2001, 'Optimization of the temporal response of II-IV direct type semiconductor detectors for flat-panel pulsed X-ray imaging', IEEE Transactions on Instrumentation and Measurement, vol. 50, no. 6, pp. 1610-1614. https://doi.org/10.1109/19.982954

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abstract = "The rising and falling edges of detected signal pulses have been measured utilizing x-ray ionization of a planar Cd 1-xZn xTe system under different irradiation geometries, at different detector thicknesses, and applied electric fields. The experimental results of this study indicate that the time response of the CdZnTe based x-ray system is suitable for digital pulsed radiographic applications.",

keywords = "CdZnTe detector, Flat-panel digital radiography, Pulsed x-ray imaging, Temporal response",

author = "Giakos, {George C.} and R. Guntupalli and R. Nemer and J. Odogba and N. Shah and S. Vedantham and S. Suryanarayanan and S. Chowdhury and Passerini, {A. G.} and K. Mehta and S. Sumrain and N. Patnekar and K. Nataraj and E. Evans and F. Russo",

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doi = "10.1109/19.982954",

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T1 - Optimization of the temporal response of II-IV direct type semiconductor detectors for flat-panel pulsed X-ray imaging

AU - Giakos, George C.

AU - Guntupalli, R.

AU - Nemer, R.

AU - Odogba, J.

AU - Shah, N.

AU - Vedantham, S.

AU - Suryanarayanan, S.

AU - Chowdhury, S.

AU - Passerini, A. G.

AU - Mehta, K.

AU - Sumrain, S.

AU - Patnekar, N.

AU - Nataraj, K.

AU - Evans, E.

AU - Russo, F.

PY - 2001/12

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N2 - The rising and falling edges of detected signal pulses have been measured utilizing x-ray ionization of a planar Cd 1-xZn xTe system under different irradiation geometries, at different detector thicknesses, and applied electric fields. The experimental results of this study indicate that the time response of the CdZnTe based x-ray system is suitable for digital pulsed radiographic applications.

AB - The rising and falling edges of detected signal pulses have been measured utilizing x-ray ionization of a planar Cd 1-xZn xTe system under different irradiation geometries, at different detector thicknesses, and applied electric fields. The experimental results of this study indicate that the time response of the CdZnTe based x-ray system is suitable for digital pulsed radiographic applications.

KW - CdZnTe detector

KW - Flat-panel digital radiography

KW - Pulsed x-ray imaging

KW - Temporal response

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Optimization of the temporal response of II-IV direct type semiconductor detectors for flat-panel pulsed X-ray imaging

Abstract

Keywords

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