Optical Interferometry with Transmitted Haidinger Fringes Through a Plane Parallel Plate

C. Lee, J. E. Park, H. Choi, J. Kim, M. Cha, J. Jin

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Hadinger fringes can be observed when a quasi-monochromatic extended source is viewed through a plane parallel plate. We present two applications of Haidinger fringes; measurements of the thickness profiles of glass plates and laser wavelengths.

Original languageEnglish (US)
Title of host publication2018 Conference on Lasers and Electro-Optics Pacific Rim, CLEO-PR 2018
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781943580453
DOIs
StatePublished - Jul 2 2018
Event2018 Conference on Lasers and Electro-Optics Pacific Rim, CLEO-PR 2018 - Wanchai, Hong Kong
Duration: Jul 29 2018Aug 3 2018

Publication series

Name2018 Conference on Lasers and Electro-Optics Pacific Rim, CLEO-PR 2018

Conference

Conference2018 Conference on Lasers and Electro-Optics Pacific Rim, CLEO-PR 2018
Country/TerritoryHong Kong
CityWanchai
Period7/29/188/3/18

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Atomic and Molecular Physics, and Optics

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