Optical characterization of semiconductor microcavities by spatially resolved imaging and resonant Rayleigh scattering

M. Gurioli; F. Bogani; D. S. Wiersma; P. Roussignol; G. Cassabois; G. Khitrova; H. Gibbs

doi:10.1002/1521-396X(200204)190:2<363::AID-PSSA363>3.0.CO;2-O

Optical characterization of semiconductor microcavities by spatially resolved imaging and resonant Rayleigh scattering

M. Gurioli, F. Bogani, D. S. Wiersma, P. Roussignol, G. Cassabois, G. Khitrova, H. Gibbs

Optical Sciences, College of

Research output: Contribution to journal › Article › peer-review

4 Scopus citations

Abstract

It is shown that images of the coherent emission from microcavity (MC) surfaces can be used for the characterization of both intrinsic and extrinsic optical properties. The method allows one to overcome the well-known problem of inhomogeneous broadening due to the MC wedge. In addition, the presence of static disorder associated with dielectric fluctuations in a Bragg reflector is observed. This is also confirmed by resonant Rayleigh scattering measurement and it is attributed to misfit dislocations induced by the large thickness of the mismatched AlGaAs alloy in the Bragg mirrors.

Original language	English (US)
Pages (from-to)	363-367
Number of pages	5
Journal	Physica Status Solidi (A) Applied Research
Volume	190
Issue number	2
DOIs	https://doi.org/10.1002/1521-396X(200204)190:2<363::AID-PSSA363>3.0.CO;2-O
State	Published - Apr 2002

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics

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10.1002/1521-396X(200204)190:2<363::AID-PSSA363>3.0.CO;2-O

Cite this

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AU - Gurioli, M.

AU - Bogani, F.

AU - Wiersma, D. S.

AU - Roussignol, P.

AU - Cassabois, G.

AU - Khitrova, G.

AU - Gibbs, H.

PY - 2002/4

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N2 - It is shown that images of the coherent emission from microcavity (MC) surfaces can be used for the characterization of both intrinsic and extrinsic optical properties. The method allows one to overcome the well-known problem of inhomogeneous broadening due to the MC wedge. In addition, the presence of static disorder associated with dielectric fluctuations in a Bragg reflector is observed. This is also confirmed by resonant Rayleigh scattering measurement and it is attributed to misfit dislocations induced by the large thickness of the mismatched AlGaAs alloy in the Bragg mirrors.

AB - It is shown that images of the coherent emission from microcavity (MC) surfaces can be used for the characterization of both intrinsic and extrinsic optical properties. The method allows one to overcome the well-known problem of inhomogeneous broadening due to the MC wedge. In addition, the presence of static disorder associated with dielectric fluctuations in a Bragg reflector is observed. This is also confirmed by resonant Rayleigh scattering measurement and it is attributed to misfit dislocations induced by the large thickness of the mismatched AlGaAs alloy in the Bragg mirrors.

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Optical characterization of semiconductor microcavities by spatially resolved imaging and resonant Rayleigh scattering

Abstract

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