On-machine metrology for aspheric optics testing

Christopher W. King; Niall McGee; David Loke; David Riley; Gerry McCavana; Richard Freeman; Roger Morton; David Walker; Sam Wei; Ping Zhou

On-machine metrology for aspheric optics testing

Christopher W. King
, Niall McGee
, David Loke
, David Riley
, Gerry McCavana
, Richard Freeman
, Roger Morton
, David Walker
, Sam Wei
, Ping Zhou

Optical Sciences, College of

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English (US)
Title of host publication	Proceedings - ASPE Summer Topical Meeting on Precision Interferometric Metrology, ASPE 2010
Pages	33-38
Number of pages	6
State	Published - 2010
Event	ASPE Summer Topical Meeting on Precision Interferometric Metrology, ASPE 2010 - Asheville, NC, United States Duration: Jun 23 2010 → Jun 25 2010

Publication series

Name	Proceedings - ASPE Summer Topical Meeting on Precision Interferometric Metrology, ASPE 2010
Volume	49

Other

Other	ASPE Summer Topical Meeting on Precision Interferometric Metrology, ASPE 2010
Country/Territory	United States
City	Asheville, NC
Period	6/23/10 → 6/25/10

ASJC Scopus subject areas

Engineering (miscellaneous)

Cite this

King, C. W., McGee, N., Loke, D., Riley, D., McCavana, G., Freeman, R., Morton, R., Walker, D., Wei, S., & Zhou, P. (2010). On-machine metrology for aspheric optics testing. In Proceedings - ASPE Summer Topical Meeting on Precision Interferometric Metrology, ASPE 2010 (pp. 33-38). (Proceedings - ASPE Summer Topical Meeting on Precision Interferometric Metrology, ASPE 2010; Vol. 49).

On-machine metrology for aspheric optics testing. / King, Christopher W.; McGee, Niall; Loke, David et al.
Proceedings - ASPE Summer Topical Meeting on Precision Interferometric Metrology, ASPE 2010. 2010. p. 33-38 (Proceedings - ASPE Summer Topical Meeting on Precision Interferometric Metrology, ASPE 2010; Vol. 49).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

King, CW, McGee, N, Loke, D, Riley, D, McCavana, G, Freeman, R, Morton, R, Walker, D, Wei, S & Zhou, P 2010, On-machine metrology for aspheric optics testing. in Proceedings - ASPE Summer Topical Meeting on Precision Interferometric Metrology, ASPE 2010. Proceedings - ASPE Summer Topical Meeting on Precision Interferometric Metrology, ASPE 2010, vol. 49, pp. 33-38, ASPE Summer Topical Meeting on Precision Interferometric Metrology, ASPE 2010, Asheville, NC, United States, 6/23/10.

@inproceedings{72138586be544e5fa1c6096122f3ddfd,

title = "On-machine metrology for aspheric optics testing",

author = "King, \{Christopher W.\} and Niall McGee and David Loke and David Riley and Gerry McCavana and Richard Freeman and Roger Morton and David Walker and Sam Wei and Ping Zhou",

year = "2010",

language = "English (US)",

isbn = "9781887706544",

series = "Proceedings - ASPE Summer Topical Meeting on Precision Interferometric Metrology, ASPE 2010",

pages = "33--38",

booktitle = "Proceedings - ASPE Summer Topical Meeting on Precision Interferometric Metrology, ASPE 2010",

note = "ASPE Summer Topical Meeting on Precision Interferometric Metrology, ASPE 2010 ; Conference date: 23-06-2010 Through 25-06-2010",

}

TY - GEN

T1 - On-machine metrology for aspheric optics testing

AU - King, Christopher W.

AU - McGee, Niall

AU - Loke, David

AU - Riley, David

AU - McCavana, Gerry

AU - Freeman, Richard

AU - Morton, Roger

AU - Walker, David

AU - Wei, Sam

AU - Zhou, Ping

PY - 2010

Y1 - 2010

UR - https://www.scopus.com/pages/publications/84884311130

UR - https://www.scopus.com/pages/publications/84884311130#tab=citedBy

M3 - Conference contribution

AN - SCOPUS:84884311130

SN - 9781887706544

T3 - Proceedings - ASPE Summer Topical Meeting on Precision Interferometric Metrology, ASPE 2010

SP - 33

EP - 38

BT - Proceedings - ASPE Summer Topical Meeting on Precision Interferometric Metrology, ASPE 2010

T2 - ASPE Summer Topical Meeting on Precision Interferometric Metrology, ASPE 2010

Y2 - 23 June 2010 through 25 June 2010

ER -

On-machine metrology for aspheric optics testing

Publication series

Other

ASJC Scopus subject areas

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Cite this