On-machine metrology for aspheric optics testing

Christopher W. King; Niall McGee; David Loke; David Riley; Gerry McCavana; Richard Freeman; Roger Morton; David Walker; Sam Wei; Ping Zhou

On-machine metrology for aspheric optics testing

Christopher W. King, Niall McGee, David Loke, David Riley, Gerry McCavana, Richard Freeman, Roger Morton, David Walker, Sam Wei, Ping Zhou

Optical Sciences, College of

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English (US)
Title of host publication	Proceedings - ASPE Summer Topical Meeting on Precision Interferometric Metrology, ASPE 2010
Pages	33-38
Number of pages	6
State	Published - 2010
Event	ASPE Summer Topical Meeting on Precision Interferometric Metrology, ASPE 2010 - Asheville, NC, United States Duration: Jun 23 2010 → Jun 25 2010

Publication series

Name	Proceedings - ASPE Summer Topical Meeting on Precision Interferometric Metrology, ASPE 2010
Volume	49

Other

Other	ASPE Summer Topical Meeting on Precision Interferometric Metrology, ASPE 2010
Country/Territory	United States
City	Asheville, NC
Period	6/23/10 → 6/25/10

ASJC Scopus subject areas

Engineering (miscellaneous)

Cite this

King, C. W., McGee, N., Loke, D., Riley, D., McCavana, G., Freeman, R., Morton, R., Walker, D., Wei, S., & Zhou, P. (2010). On-machine metrology for aspheric optics testing. In Proceedings - ASPE Summer Topical Meeting on Precision Interferometric Metrology, ASPE 2010 (pp. 33-38). (Proceedings - ASPE Summer Topical Meeting on Precision Interferometric Metrology, ASPE 2010; Vol. 49).

On-machine metrology for aspheric optics testing. / King, Christopher W.; McGee, Niall; Loke, David et al.
Proceedings - ASPE Summer Topical Meeting on Precision Interferometric Metrology, ASPE 2010. 2010. p. 33-38 (Proceedings - ASPE Summer Topical Meeting on Precision Interferometric Metrology, ASPE 2010; Vol. 49).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

King, CW, McGee, N, Loke, D, Riley, D, McCavana, G, Freeman, R, Morton, R, Walker, D, Wei, S & Zhou, P 2010, On-machine metrology for aspheric optics testing. in Proceedings - ASPE Summer Topical Meeting on Precision Interferometric Metrology, ASPE 2010. Proceedings - ASPE Summer Topical Meeting on Precision Interferometric Metrology, ASPE 2010, vol. 49, pp. 33-38, ASPE Summer Topical Meeting on Precision Interferometric Metrology, ASPE 2010, Asheville, NC, United States, 6/23/10.

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title = "On-machine metrology for aspheric optics testing",

author = "King, {Christopher W.} and Niall McGee and David Loke and David Riley and Gerry McCavana and Richard Freeman and Roger Morton and David Walker and Sam Wei and Ping Zhou",

year = "2010",

language = "English (US)",

isbn = "9781887706544",

series = "Proceedings - ASPE Summer Topical Meeting on Precision Interferometric Metrology, ASPE 2010",

pages = "33--38",

booktitle = "Proceedings - ASPE Summer Topical Meeting on Precision Interferometric Metrology, ASPE 2010",

note = "ASPE Summer Topical Meeting on Precision Interferometric Metrology, ASPE 2010 ; Conference date: 23-06-2010 Through 25-06-2010",

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TY - GEN

T1 - On-machine metrology for aspheric optics testing

AU - King, Christopher W.

AU - McGee, Niall

AU - Loke, David

AU - Riley, David

AU - McCavana, Gerry

AU - Freeman, Richard

AU - Morton, Roger

AU - Walker, David

AU - Wei, Sam

AU - Zhou, Ping

PY - 2010

Y1 - 2010

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M3 - Conference contribution

AN - SCOPUS:84884311130

SN - 9781887706544

T3 - Proceedings - ASPE Summer Topical Meeting on Precision Interferometric Metrology, ASPE 2010

SP - 33

EP - 38

BT - Proceedings - ASPE Summer Topical Meeting on Precision Interferometric Metrology, ASPE 2010

T2 - ASPE Summer Topical Meeting on Precision Interferometric Metrology, ASPE 2010

Y2 - 23 June 2010 through 25 June 2010

ER -

On-machine metrology for aspheric optics testing

Publication series

Other

ASJC Scopus subject areas

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Cite this