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ON-MACHIINE METROLOGY FOR TOOL CHARACTERIZATION

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

To meet the critical demands of on-machine metrology in precision optical fabrication, a dual-mode, snapshot optical metrology system, DualSnap™, has been developed, enabling in-situ measurements and real-time qualilty control. The system integrates two working modes: a laser interferometer and an LED interference microscope, allowing the simultaneous evaluation of surface form and roughness. With its dual-mode capability, snapshot acquistion, and compact design, the DualSnap™ is exceptioanlly well-suited for comprehensive quality monitoring in manufacturing enviroments. A typical application is the characterization of diamond tools in diamond turning machines, including analysis of tool geometries, surface integrity, and wear patterns. On-machine tool characterization using DualSnap™ offers a practical solution for improving process efficiency, optimizing machining strategies, and minimizing downtime in precision fabrication.

Original languageEnglish (US)
Title of host publicationProceedings of the 40th Annual Meeting of the American Society for Precision Engineering, ASPE 2025
PublisherAmerican Society for Precision Engineering, ASPE
Pages353-354
Number of pages2
ISBN (Electronic)9781887706629
StatePublished - 2025
Event40th Annual Meeting of the American Society for Precision Engineering, ASPE 2025 - San Diego, United States
Duration: Nov 3 2025Nov 7 2025

Publication series

NameProceedings of the 40th Annual Meeting of the American Society for Precision Engineering, ASPE 2025

Conference

Conference40th Annual Meeting of the American Society for Precision Engineering, ASPE 2025
Country/TerritoryUnited States
CitySan Diego
Period11/3/2511/7/25

ASJC Scopus subject areas

  • Geochemistry and Petrology

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