TY - GEN
T1 - Observation of 4-ms response-time in a photorefractive polymer
AU - Herlocker, Jon A.
AU - Ferrio, Kyle B.
AU - Hendrickx, Eric
AU - Guenther, B. D.
AU - Mery, Stephane
AU - Kippelen, Bernard
AU - Peyghambarian, Nasser
PY - 1999
Y1 - 1999
N2 - Efficient photorefractive polymers hold great potential for optical data processing and storage and so have been a topic of intense investigations in recent years. Materials with nearly 100% diffraction efficiencies have been developed, but these have been generally characterized by much slower responses than their less efficient inorganic counterparts. In this report, we describe a 4-ms initial rise-time using a visible-transparent chromophore in a PVK-based polymer of Tg = 39°C for 48-V/μm bias projected along the grating vector and 250-m W/cm2 writing beams. This fast component consistently accounts for 90% of the steady-state response and is analyzed as a function of bias field. We also present transient ellipsometry measurements of an orientational response significantly faster than the grating development, suggesting that chromophore alignment speed does not limit transient grating formation. We describe the role of such underlying property measurements in understanding photorefractive transient behavior, and prospects for further improvements.
AB - Efficient photorefractive polymers hold great potential for optical data processing and storage and so have been a topic of intense investigations in recent years. Materials with nearly 100% diffraction efficiencies have been developed, but these have been generally characterized by much slower responses than their less efficient inorganic counterparts. In this report, we describe a 4-ms initial rise-time using a visible-transparent chromophore in a PVK-based polymer of Tg = 39°C for 48-V/μm bias projected along the grating vector and 250-m W/cm2 writing beams. This fast component consistently accounts for 90% of the steady-state response and is analyzed as a function of bias field. We also present transient ellipsometry measurements of an orientational response significantly faster than the grating development, suggesting that chromophore alignment speed does not limit transient grating formation. We describe the role of such underlying property measurements in understanding photorefractive transient behavior, and prospects for further improvements.
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M3 - Conference contribution
AN - SCOPUS:0032596773
SN - 0819430935
T3 - Proceedings of SPIE - The International Society for Optical Engineering
SP - 168
EP - 174
BT - Proceedings of SPIE - The International Society for Optical Engineering
PB - Society of Photo-Optical Instrumentation Engineers
T2 - Proceedings of the 1999 Organic Photonic Materials and Devices
Y2 - 25 January 1999 through 27 January 1999
ER -