Static feature-specific imaging (SFSI), where the measurement basis remains fixed/static during the data measurement process, has been shown to be superior to conventional imaging for reconstruction tasks. Here, we describe an adaptive approach that utilizes past measurements to inform the choice of measurement basis for future measurements in an FSI system, with the goal of maximizing the reconstruction fidelity while employing the fewest measurements. An algorithm to implement this adaptive approach is developed for FSI systems, and the resulting systems are referred to as adaptive FSI (AFSI) systems. A simulation study is used to analyze the performance of the AFSI system for two choices of measurement basis: principal component (PC) and Hadamard. Here, the root mean squared error (RMSE) metric is employed to quantify the reconstruction fidelity. We observe that an AFSI system achieves as much as 30% lower RMSE compared to an SFSI system. The performance improvement of the AFSI systems is verified using an experimental setup employed using a digital micromirror device (DMD) array.
|Original language||English (US)|
|State||Published - Dec 1 2010|
ASJC Scopus subject areas
- Atomic and Molecular Physics, and Optics
- Engineering (miscellaneous)
- Electrical and Electronic Engineering